2020
DOI: 10.1088/1742-6596/1693/1/012210
|View full text |Cite
|
Sign up to set email alerts
|

Research on automatic defect identification technology of electronic components

Abstract: Aiming at the problems of low efficiency and low accuracy caused by manual defect detection of electronic components, FCN, SegNet/DeconvNet and DeepLab and other deep learning technologies are studied. Using Caffe, Keras, PyTorch and other frameworks, an automatic defect identification system for electronic components is developed to distinguish qualified products from unqualified ones, so as to realize intelligent defect detection of electronic components. At the same time, the detection accuracy rate is grea… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2023
2023
2023
2023

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 9 publications
0
1
0
Order By: Relevance
“…Defects that can be repaired with automatic repair tools still account for a small part of all defects. According to the repair results of the existing error correction tools in the common error log, all the repair tools can repair less than 30% of the whole data set [8]. The accuracy of patches generated by automatic repair tools still can't meet the requirements of industrial applications.…”
Section: Challenges Faced By Automatic Repair Technologymentioning
confidence: 99%
“…Defects that can be repaired with automatic repair tools still account for a small part of all defects. According to the repair results of the existing error correction tools in the common error log, all the repair tools can repair less than 30% of the whole data set [8]. The accuracy of patches generated by automatic repair tools still can't meet the requirements of industrial applications.…”
Section: Challenges Faced By Automatic Repair Technologymentioning
confidence: 99%