AOPC 2021: Optical Sensing and Imaging Technology 2021
DOI: 10.1117/12.2605528
|View full text |Cite
|
Sign up to set email alerts
|

Research on X-ray in-situ image processing technology for electric power strain clamp

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
3
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 1 publication
0
3
0
Order By: Relevance
“…It can be seen from the simulation results that the proposed algorithm can obtain the optimal imaging voltage through the calculation for the simultaneous imaging of objects with a large difference in absorption coefficients [40,41].…”
Section: Strain Clamp X-ray Imaging Testmentioning
confidence: 97%
“…It can be seen from the simulation results that the proposed algorithm can obtain the optimal imaging voltage through the calculation for the simultaneous imaging of objects with a large difference in absorption coefficients [40,41].…”
Section: Strain Clamp X-ray Imaging Testmentioning
confidence: 97%
“…Strain refers to the local relative deformation of an object when subjected to external forces or non-uniform temperature field. In structural engineering, equipment detection, and health monitoring, daily inspection and maintenance are critical to maintain the service life of equipment [1][2][3][4][5]. Strain monitoring is an excellent means for equipment safety detection and management.…”
Section: Introductionmentioning
confidence: 99%
“…The present deep learning-based inspection solutions for strain clamps are classifying or detecting defective samples, but defective samples are not easy to obtain, and the constructed defective sample library does not include all abnormalities. The existing research focused on single defects with obvious characteristics and the generalization ability needs further verification [3,25,26]. Defect detection methods based on defective samples naturally could not satisfy the real demands.…”
Section: Introductionmentioning
confidence: 99%