Reseeding LFSR for Test Pattern Generation

Dilip, Patare Snehal; Somanathan, Geethu Remadevi; Bhakthavatchalu, Ramesh

doi:10.1109/iccsp.2019.8698025

Cited by 27 publications

(2 citation statements)

References 7 publications

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“…Data quantities that need longer testing times are needed. Due to the high cost and affordable price of automated test equipment (ATE) testing programs, it is currently rarely considered for SOC testing [3].…”

Section: Basic Introductionmentioning

confidence: 99%

High-performance LFSR circuit design based on XOR gates

Xiao

2023

J. Phys.: Conf. Ser.

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The research discussed in this article is focused on analysing the effects of XOR gates based on different logic families, namely MOS Current Mode Logic (MCML), dynamic current logic, and PTL, on the performance of linear feedback shift register (LFSR) circuits. The aim of the study is to evaluate the power dissipation and critical path latency of the circuits while comparing the results with earlier works in the field. To achieve this, the researchers implemented the 3, 4, and 5-bit LFSR circuits using Verilog HDL code and synthesized them on the Cadence tool using 90nm CMOS technology. The study concludes that LFSR circuits based on XOR gates outperform previous LFSR circuits in terms of power dissipation. The research also offers a comparative analysis of the different types of XOR gates used in the LFSR circuits, highlighting the advantages and disadvantages of each type. The results of the study can be useful for researchers working in the field of circuit design, as well as for practitioners who are interested in developing low-power and efficient LFSR circuits.

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Section: Basic Introductionmentioning

confidence: 99%

High-performance LFSR circuit design based on XOR gates

Xiao

2023

J. Phys.: Conf. Ser.

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“…But these techniques are not compatible with the standard CMOS fabrication process and eventually increase the complexity in the fabrication. With slight modification in the architecture of LFSR, highly random patterns can be achieved (6)(7)(8) . But this increases the area and complexity with increased length.…”

Section: Introductionmentioning

confidence: 99%

Design, Implementation and Performance Analysis of Test Pattern Generator for Built-In Self-Test using m-GDI Technology

Kumar¹,

Kariyappa²,

Kurian³

2021

IJST

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Background: A Linear Feedback Shift Register (LFSR) is typically used for generating the test patterns in built-in self-test (BIST) as it produces pseudorandom patterns at every clock cycle. These pseudo-random patterns are used as test vectors for testing the VLSI circuits. Objective: The pseudorandom patterns generated by the LFSR exhibit low-correlation among the patterns, this increases the switching activity and power dissipation while testing the VLSI circuit. Thus, to reduce the testing power, modified gate diffusion input (m-GDI) logic based LFSR in 45nm technology is proposed in this paper. Methods: The circuits are developed on m-GDI technology using the Cadence virtuoso tool and a spectre simulator is used to carry out the simulation. Findings: Comparative analysis revealed that the delay and power are reduced significantly, for the proposed design when compared to the existing LFSRs in conventional CMOS, GDI and reversible logic. Novelty and applications: In conventional LFSR, an external source is necessary to load the seed value and it dissipates more power. But in the proposed design, the seed value is generated by the circuit itself. This reduces the power and critical path delay. Further a complete zero patterns is not possible in conventional LFSR design. But in proposed design, all zero pattern is plausible. The design obtained from this study can be applied in low-power, high-speed BIST circuits.

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A Novel Cryptographic Approach to Implement Confidentiality Using Point Reflection Property

Das

Kar

2020

Communications in Computer and Information Science

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Reseeding LFSR for Test Pattern Generation

Cited by 27 publications

References 7 publications

High-performance LFSR circuit design based on XOR gates

High-performance LFSR circuit design based on XOR gates

Design, Implementation and Performance Analysis of Test Pattern Generator for Built-In Self-Test using m-GDI Technology

A Novel Cryptographic Approach to Implement Confidentiality Using Point Reflection Property

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