Residual Stress Analysis by White High Energy X‐rays

Genzel, Christoph; Pyzalla, A.

doi:10.1002/9783527621927.ch10

Cited by 2 publications

(1 citation statement)

References 45 publications

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“…In this context, groundbreaking strategies outlined in [27][28][29] have to be mentioned applying the universal-plot method to analyze stress-depth distributions. Further systematic studies with regard to measuring and evaluation strategies can be found in e. g. [30][31][32]. In this context also special technical aspects of energy resolved detectors [33] were investigated.…”

Section: Key Factors Of Energy Resolved Residual Stress Analysis Unde...mentioning

confidence: 99%

Energy Resolved Residual Stress Analysis with Laboratory X-Ray Sources

Liehr

Zinn

Degener

et al. 2017

HTM Journal of Heat Treatment and Materials

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It is well known that existing residual stress fields play an important role for strength and lifetime of components. Consequently there is a great interest in the availability of fast, reliable and possibly nondestructive methods for their determination. In this context, X-ray diffraction methods play an important role in technical practice as well as in scientific research. They are based on the determination of lattice strains from which residual stresses are determined applying Hooke's law with appropriate elastic constants. In this paper – after a short survey of the basic principles – characteristic features of energy resolved methods for laboratory applications compared with angle resolved methods are outlined. A corresponding measuring device is presented and characteristic examples are given to demonstrate the possibilities and limitations of the method.

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