2005
DOI: 10.1179/174328405x14380
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Residual stress and stored energy during recrystallisation in polycrystalline copper

Abstract: A general X-ray multireflection method was applied to determine the stress level in deformed and recrystallised polycrystalline copper samples. Different reflections hkl were simultaneously used in the fitting procedure. The anisotropic diffraction elastic constants were calculated using the self consistent model and crystallographic texture. A significant decrease of the first order residual stresses was observed during recovery and recrystallisation. Diffraction peak widths and intensities were also examined… Show more

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Cited by 7 publications
(4 citation statements)
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“…are measured for more than one hkl reflection. Then, so called multireflection method for data analysis can be used to determine the stress field from equivalent lattice parameters, defined as <a(φ,ψ)> {hkl} = [32,46]. In the absence of the second order stresses and in the case of a quasi-isotropic sample (without texture), the equivalent lattice parameters <a(φ,ψ)> {hkl} measured in L 3 direction ( Fig.…”
Section: Experimental Techniquementioning
confidence: 99%
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“…are measured for more than one hkl reflection. Then, so called multireflection method for data analysis can be used to determine the stress field from equivalent lattice parameters, defined as <a(φ,ψ)> {hkl} = [32,46]. In the absence of the second order stresses and in the case of a quasi-isotropic sample (without texture), the equivalent lattice parameters <a(φ,ψ)> {hkl} measured in L 3 direction ( Fig.…”
Section: Experimental Techniquementioning
confidence: 99%
“…In the absence of the second order stresses and in the case of a quasi-isotropic sample (without texture), the equivalent lattice parameters <a(φ,ψ)> {hkl} measured in L 3 direction ( Fig. 2) are given by the well known relation [3,4,32 . They depend on a chosen reflection hkl but do not depend on the orientation of the scattering vector (φ,ψ) defining direction of strain measurement.…”
Section: Experimental Techniquementioning
confidence: 99%
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“…Measurements carried out using laboratory X-rays or neutron diffraction have, however, shown the presence of residual stresses in partially recrystallized samples (e.g., [16][17][18][19]). These results are, nevertheless, averaged over the whole gauge volume, i.e., over a large number of recrystallizing grains and also their surrounding deformed matrix.…”
Section: Introductionmentioning
confidence: 99%