2015
DOI: 10.1007/s11665-015-1393-5
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Residual Stress and Surface Energy of Sputtered TiN Films

Abstract: Morphology, structure, residual stress, and surface energy of magnetron-sputtered titanium nitride (TiN) thin films, deposited at 300°C with a thickness in the 0.5-1.7 lm range, were characterized. Film microstructure, the origin of residual stress, and its effect on the surface energy were analyzed. The grain size increased with the film thickness. X-ray diffraction showed (200) to (111) preferred orientation transitions with the increasing film thickness. The stress in the TiN films changed from compressive … Show more

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Cited by 41 publications
(14 citation statements)
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“…In this case, a suitable film/substrate adhesion was observed: this behavior could be due to the thickness reduction. Indeed, since the thermal expansion coefficient of the film depends on the thickness [ 30 , 33 ], it is reasonable to believe there is a contribution of the thermal stress component change on TiN4A film’s adequate adhesion to the alumina substrate.…”
Section: Resultsmentioning
confidence: 99%
“…In this case, a suitable film/substrate adhesion was observed: this behavior could be due to the thickness reduction. Indeed, since the thermal expansion coefficient of the film depends on the thickness [ 30 , 33 ], it is reasonable to believe there is a contribution of the thermal stress component change on TiN4A film’s adequate adhesion to the alumina substrate.…”
Section: Resultsmentioning
confidence: 99%
“…Titanium and tungsten nitride ceramics: Titanium nitride (TiN) has a low electrical resistivity that is comparable to some metals, high stiffness (Young’s modulus of 427–590 GPa) and high hardness, high melting temperature (2930 °C), high corrosion resistance [ 140 ], and low surface energy [ 141 ] – all beneficial properties for NEM switch applications. TiN is also one of the materials used in almost all standard surface and bulk micromachining, thus available from routine CMOS production, and it can be integrated in existing devices.…”
Section: Reviewmentioning
confidence: 99%
“…The formation of metallic nitrides depends on the reactivity of the deposited compounds during the evaporation; however, these were not characterized in the coating diffraction pattern due to the excellent stability of the Ni 3 B and TiB 2 deposited phases (figure 3). Microcracks at the surface were not detected due to the low residual stresses on the film obtained with the complete recrystallization of the phases [23]. Independent that the formation of metallic nitrides was not possible, the appearance of the coatings is good with no possibility of detachment.…”
Section: Sputtered Thin Films 321 Xrd Characterizationmentioning
confidence: 97%