2005
DOI: 10.1784/insi.47.2.91.58977
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Residual stress determination and defect detection using electronic speckle pattern interferometry

Abstract: The paper deals with the methodology of determining residual stresses using Electronic Speckle Pattern Interferometry (ESPI). ESPI can be used as a truly non-destructive testing technique in that it is a laser based, optical, full field, non contacting method which reveals surface displacements to an accuracy of approximately 300 nanometres when a Helium Neon laser is used. In a simple experiment, a fixed-ends rectangular aluminium plate was subjected to uniform loading and the out of plane surface displacemen… Show more

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