Residual Stress Distribution and Characterization on Multi‐Curved Armor Tiles

Abstract

Residual stresses were measured on numerous multi-curved, ballistic tiles made from either silicon carbide or boron carbide. Residual stresses were measured at 155 locations to determine what affect parameters such as material, material processing, tile geometry, and manufacturer had on residual stress type and magnitude. 23% of data points had tensile residual stress. The highest residual stresses were measured in tiles with either the largest surface area or smallest plate thickness. Higher stresses were measured in silicon carbide tiles compared with boron carbide tiles. Residual stresses in tiles consolidated by hot pressing measured on average 10 MPa higher than those by pressureless sintering. *lwang@oakland.edu

Residual stress measurement of SiC Tile/Al-SiC p hybrid composites using neutron diffraction

“…Among nondestructive residual stress measurement methods, x-ray diffraction (XRD) and neutron diffraction are the most popular ones [19][20][21]. Although both XRD and neutron diffraction use similar principles to measure the residual stress, XRD can only detect the residual stress on the surface of materials.…”