2008
DOI: 10.1016/j.actamat.2007.09.014
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Residual stress distributions around indentations and scratches in polycrystalline Al2O3 and Al2O3/SiC nanocomposites measured using fluorescence probes

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Cited by 37 publications
(40 citation statements)
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“…Such an approach has been used in the past by Pecorari et al [20], who modelled the effect of surface damage on Rayleigh wave velocity in brittle materials, and by Wu et al [21], who modelled the effects of residual stress. For simplicity, we also assume that this surface layer is of sufficient thickness that any influence of the bulk material can be ignored and that the elastic properties of this surface layer are isotropic.…”
Section: Discussionmentioning
confidence: 99%
“…Such an approach has been used in the past by Pecorari et al [20], who modelled the effect of surface damage on Rayleigh wave velocity in brittle materials, and by Wu et al [21], who modelled the effects of residual stress. For simplicity, we also assume that this surface layer is of sufficient thickness that any influence of the bulk material can be ignored and that the elastic properties of this surface layer are isotropic.…”
Section: Discussionmentioning
confidence: 99%
“…Raman peak profile analysis was used to calculate the characteristic crystallite size [22], compressive residual stress [19] and dislocation density [39] across sub-surface regions of the graphite samples. Further details on the models used in these calculations can be found elsewhere [19,22,39,40]. The crystallite size was determined based on the integrated area ratio between the D and G peak intensities, termed I D and I G respectively, using the following equation:…”
Section: Raman Mapping Area Spectroscopymentioning
confidence: 99%
“…It has been reported that the broadening of the Raman G-line in irradiated graphite corresponds with the dislocation population over the scanned volume and results from the strain field around dislocations [41]. In order to quantify the number of preexisting dislocations and those introduced during irradiation based on the broadening of the Raman G-peak, the model of Wu et al (2008) was adopted [39]. In this model, dislocation densities can be estimated based on the broadening of a characteristic peak in a spectroscopic line profile following the function:…”
Section: Raman Mapping Area Spectroscopymentioning
confidence: 99%
“…A comparative quantification of this data reveals a discernible increase of 6.8 cm -1 in the full width half maximum (FWHM). By adopting the model of Wu et al [18], we can convert this value into the dislocation density, in this case estimated at 4.02 × 10 14 m -2 .…”
Section: Resultsmentioning
confidence: 99%