2015
DOI: 10.1016/j.surfcoat.2014.12.028
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Residual stress gradients in α-Al2O3 hard coatings determined by pencil-beam X-ray nanodiffraction: The influence of blasting media

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Cited by 41 publications
(14 citation statements)
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“…The coating deposition was carried out in an industrial scale SuCoTec SCT600TH CVD plant. Subsequent to the deposition, the coated inserts were subjected to a wet blasting treatment with the central aim of changing the residual stress state of coating and substrate from tensile to compressive as summarised in our previous work [14].…”
Section: Experiments and Methodologymentioning
confidence: 99%
“…The coating deposition was carried out in an industrial scale SuCoTec SCT600TH CVD plant. Subsequent to the deposition, the coated inserts were subjected to a wet blasting treatment with the central aim of changing the residual stress state of coating and substrate from tensile to compressive as summarised in our previous work [14].…”
Section: Experiments and Methodologymentioning
confidence: 99%
“…The reported slopes result from a linear fit of the experimental data. [81] Complementary to XRD, electron microscopy techniques, such as the above mentioned TEM or SEM in combination with electron backscatter diffraction (EBSD) are commonly utilized to investigate the microstructural evolution of the samples. [79] Next to the substrate/coating interface, the TiN base-layer exhibits a rather small grain size, which increases with increasing coating thickness, typical for competitive growth.…”
Section: Characterization Of Microstructure Texture Domain Size Anmentioning
confidence: 99%
“…Decomposition of the cutting insert X-ray diffraction pattern ( = 10 , È = 0) by simultaneous refinement in all measured È directions {0, 45, 90 }: pattern (open circles), decomposition (green line), difference (grey line), -Al 2 O 3 (blue line), TiCN (red line), GOF = 1.13. corresponding sample was scrutinized within the project 'residual stress gradients in -Al 2 O 3 hard coatings' (Tkadletz et al, 2015). Employing cross-sectional synchrotron X-ray nanodiffraction, the local residual stress profile (Fig.…”
Section: Figurementioning
confidence: 99%