2007
DOI: 10.1088/0953-8984/19/4/046210
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Resistance behaviour and morphological changes during electromigration in gold wires

Abstract: We present in situ scanning electron microscope electromigration measurements on fine-grained gold nanowires. The grain size of 20-40 nm is much smaller than the wire width of 1 μm. Electrical breakdown occurs in a slitlike manner, which has been observed commonly for bamboo-like or singlecrystalline wires. Furthermore, the development of void area is determined and found to increase linearly over time for these polycrystalline wires. Also, the local enhancement of the current density at the position of the cr… Show more

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Cited by 23 publications
(24 citation statements)
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“…32 Figure 10 gold/PDMS sample subjected to a 9 % tensile strain. A 800x600 µm 2 highly contrasted optical micrograph ( fig.…”
Section: Discussionmentioning
confidence: 99%
“…32 Figure 10 gold/PDMS sample subjected to a 9 % tensile strain. A 800x600 µm 2 highly contrasted optical micrograph ( fig.…”
Section: Discussionmentioning
confidence: 99%
“…An irreversible behaviour is observed resulting in a higher resistance value after cooling down. The metal layer was damaged by an effect known as electromigration (Black 1969;Lienig and Jerke 2002;Stahlmecke and Dumpich 2007) which typically occurs in metallic thin films when they are loaded with current densities [1 MA cm -2 at enhanced temperatures. With a final resistance of about 500 X the corresponding actuator was regarded to be completely damaged.…”
Section: Electrical and Thermal Limitationsmentioning
confidence: 99%
“…As a comparison, the temperature coefficient of resistance for bulk Au is 3.9 × 10 −3 K −1 [8]. Stahlmecke et al [5] have also reported a lower value for the temperature-dependent resistance of Au nanowires (2 × 10 −3 K −1 at 273 K) with a thickness of 36 nm and width of 1 µm. However, they did not measure the activation energy.…”
Section: B Electromigrationmentioning
confidence: 99%
“…To our knowledge, the activation energy of Au nanowires with the sub-100 nm thicknesses and widths has not been widely reported. This is in part because of limited available values for the temperature coefficient of resistance for nanoscale Au wires (see, for example, [5] and [6]). …”
Section: Introductionmentioning
confidence: 99%