Resistance of dielectric polymer films with fillers in metal-polymer-metal systems

Nikolaeva, M. N.; Martynenkov, A. A.; Smyslov, R. Yu.; Bugrov, Alexander N.

doi:10.1134/s107042721405019x

Cited by 3 publications

(4 citation statements)

References 14 publications

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“…The thicknesses of the films were controlled by the interference microscope using the method described in [2][3][4]. Current-voltage characteristics of the metal-composite-metal structures were obtained by the modified two-probe method [2][3][4].…”

Section: Methodsmentioning

confidence: 99%

“…The interest in the study of conducting polymers with dielectric properties can be explained by the possibility their use as components of electronic devices in various fields [1][2][3][4]. It is known [1][2][3][4][5][6][7][8] that thin films of dielectric polymers are able to conduct electricity below the electric field breakdown.…”

Section: Introductionmentioning

confidence: 99%

“…It is known [1][2][3][4][5][6][7][8] that thin films of dielectric polymers are able to conduct electricity below the electric field breakdown. Whereas doped polymers have conductivity levels similar to semiconductors.…”

Section: Introductionmentioning

confidence: 99%

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Resistance of composite films based on polystyrene and graphene oxide

Хайруллин¹,

Nikolaeva²,

Bugrov³

2016

Nanosystems: Phys. Chem. Math.

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Polystyrene films prepared by radical polymerization can conduct electric current in metal-polymer-metal structures with film thicknesses of up to 20 nanometers. Films of polystyrene and graphene oxide composite with thickness up to 3 micrometers, synthesized in similar conditions have the same electric properties. This effect is explained by presence of highly conductive graphene oxide inclusions in the dielectric polystyrene matrix.

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Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Resistance of composite films based on polystyrene and graphene oxide

Хайруллин¹,

Nikolaeva²,

Bugrov³

2016

Nanosystems: Phys. Chem. Math.

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show abstract

“…Thickness of the films was controlled by the interference microscope using the method described in [20][21][22]. Current-voltage characteristics of the metal-composite-metal structures were obtained by the modified two-probe method.…”

Section: Fig 1 Sem Images Of Graphene Oxide Flakesmentioning

confidence: 99%