1996
DOI: 10.1016/s0040-6031(96)03020-1
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Resolution of overlapping peaks and the determination of kinetic parameters for the crystallization of multicomponent system from DTA or DSC curves: I. Non-isothermal kinetics

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Cited by 15 publications
(4 citation statements)
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“…(2) and presented in Table 5. To calculate the Avrami exponent for each of the two overlapped peaks in non-leached sample, the peaks were first resolved by the method described in our work, 37 and then the Avrami exponent was calculated. TEM micrograph of the non-leached sample heat-treated at 1260 • C is shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…(2) and presented in Table 5. To calculate the Avrami exponent for each of the two overlapped peaks in non-leached sample, the peaks were first resolved by the method described in our work, 37 and then the Avrami exponent was calculated. TEM micrograph of the non-leached sample heat-treated at 1260 • C is shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…However, this method is not applicable for overlapped peaks, therefore, to determine the Avrami exponent n for each of the two overlapped peaks of NL sample, the separation of the peaks was made using computer resolving method, 37 which enables simultaneous evaluation of the sum of activation energy and Avrami exponent (E a × n).…”
Section: Methodsmentioning
confidence: 99%
“…12 To separate the individual steps of overlapping processes, many methods have been proposed. [13][14][15][16][17][18] In the paper of Wagner et al, 15 the sum of two Gaussian functions were used for fitting exothermal peaks obtained through differential scanning calorimetry of amorphous semiconducting alloys. Naya et al 16 proposed the nth-degree polynomial logistic regression model for fitting the TGA curves.…”
Section: Introductionmentioning
confidence: 99%
“…The kinetic analysis of complex reactions, such as overlapping reactions, has received the attention of a great number of authors. Overlapping reactions could be detected looking at the dependence of the activation energy on the conversion In the paper of Wagner et al., the sum of two Gaussian functions were used for fitting exothermal peaks obtained through differential scanning calorimetry of amorphous semiconducting alloys. Naya et al proposed the n th-degree polynomial logistic regression model for fitting the TGA curves.…”
Section: Introductionmentioning
confidence: 99%