2017
DOI: 10.1088/1742-6596/931/1/012027
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Resolution Properties of a Calcium Tungstate (CaWO4) Screen Coupled to a CMOS Imaging Detector

Abstract: Abstract. The aim of the current work was to assess the resolution properties of a calcium tungstate (CaWO 4 ) screen (screen coating thickness: 50.09 mg/cm 2 , actual thickness: 167.2 μm) coupled to a high resolution complementary metal oxide semiconductor (CMOS) digital imaging sensor. A 2.7x3.6 cm 2 CaWO 4 sample was extracted from an Agfa Curix universal screen and was coupled directly with the active area of the active pixel sensor (APS) CMOS sensor. Experiments were performed following the new IEC 62220-… Show more

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Cited by 5 publications
(6 citation statements)
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“…With the paste fixation method, residual air or gaps will cause the loss of optical energy and affect the resolution, while the direct deposition method is technically challenging and expensive. [ 7,8 ] Besides, the large‐area preparation capability makes traditional scintillators uncompetitive. Therefore, the exploration and development of a new‐generation scintillator material to solve the above problems are eagerly anticipated.…”
Section: Introductionmentioning
confidence: 99%
“…With the paste fixation method, residual air or gaps will cause the loss of optical energy and affect the resolution, while the direct deposition method is technically challenging and expensive. [ 7,8 ] Besides, the large‐area preparation capability makes traditional scintillators uncompetitive. Therefore, the exploration and development of a new‐generation scintillator material to solve the above problems are eagerly anticipated.…”
Section: Introductionmentioning
confidence: 99%
“…Thus, it would be of interest to integrate a scintillating material that came to the spotlight once again, with this state-ofthe-art sensor in order to further exploit their imaging characteristics. The CaWO 4 screen was directly overlaid onto the active area of the CMOS and irradiated with a BMI General Medical Merate tube having rotating Tungsten anode and inherent filtration equivalent to 2 mm Al at 70 kV (RQA-5) X-ray beam quality and source to detector distance of 156 cm [21].…”
Section: Cmos Sensormentioning
confidence: 99%
“…The updated IEC 62220-1-1:2015 [11,33,40] standard describes certain modifications, such as the method for the determination of the modulation transfer function (MTF) in which the final MTF can be now obtained only through averaging of the oversampled edge spread function (ESF) [33,[41][42][43]. The average of all oversampled ESFs was then fitted with a modified Fermi-Dirac distribution function as follows [11,21]:…”
Section: Modulation Transfer Function (Mtf)mentioning
confidence: 99%
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