Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy

Ooe, Hiroaki; Sakuishi, Tatsuya; Nogami, Makoto; Tomitori, Masahiko; Arai, Toyoko

doi:10.1063/1.4891882

Cited by 19 publications

(17 citation statements)

References 16 publications

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“…Therefore, the tip of the prongs on one side was ground with a precision metal file to make it asymmetric (arrow in Fig. 2b), 17 and then the probe was glued with thermosetting resin (Epo-Tek H74). In the case of FM-AFM only without STM measurement, a tungsten wire (Φ 0.03 mm, Nilaco) was used as a probe, and the tungsten wire was glued to the tuning fork in advance.…”

Section: Methodsmentioning

confidence: 99%

Building a Scanning Probe Microscope Using Open Source Control Software and Systems

Kishioka

2021

ANAL. SCI.

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A scanning probe microscope (SPM) operating in air and liquid was constructed using an open-source control software running on Linux, a correspondingly developed commercial SPM controller and a commercial STM head. The results are shown for highly oriented pyrolytic graphite (HOPG) and Au(111) substrate surfaces, which are typical samples for SPM measurements. The cost of building the system was much lower than that of commercial products with comparable performance. The system has great scalability and can be applied to a various environment such as ultra-high vacuum and electrochemical cell systems.

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Section: Methodsmentioning

confidence: 99%

Building a Scanning Probe Microscope Using Open Source Control Software and Systems

Kishioka

2021

ANAL. SCI.

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“…A self‐sensing qPlus‐type force sensor, comprising a quartz tuning fork, was used for the nc‐AFM; a conductive tip made of electrochemically etched tungsten wire was attached at the end of one prong of the tuning fork as a cantilever with a spring constant k of 1800 Nm −1 , while the other prong was fixed to the substrate of a force sensor holder. The prong with the tip oscillated at its resonant frequency by applying an AC voltage signal to the electrode of the tuning fork, and the oscillation amplitude was held constant . The Δ f was measured with a phase‐locked loop (PLL) FM detector (Nanosurf AG, easy PLL plus).…”

Section: Methodsmentioning

confidence: 99%

Nanomechanical Properties of Epitaxial Silicene Revealed by Noncontact Atomic Force Microscopy

Nogami

Fleurence

Yamada‐Takamura

et al. 2018

Adv Materials Inter

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particularity to form in a spontaneous and self-terminating way. [16] The so-formed silicene appears as a ZrB 2 (0001)-(2 × 2) reconstruction due to the matching of this (2 × 2) unit cell with the (√3 × √3) unit cell of silicene. [16] The structure of the Si layer adopts a so-called planar-like structure in which all Si atoms but one in the unit cell are in the same plane, and the remaining atom which is sitting above a Zr atom of the ZrB 2 (0001) surface, is protruding (see Figure 1a,b). [18,19] Moreover, the silicene layer is textured into a periodic stripe domain structure whose origin was proposed based on computational calculation results, to prevent a phonon instability. [20] However, the large-scale periodicity of the domain structure suggests that a long-range ordering governed by the release of the epitaxial strain may take place, associated with the formation of stress domains. [21] To reveal the atomic structures and mechanical properties of solid surfaces on a nanoscale, noncontact atomic force microscopy (nc-AFM) with a frequency-modulation (FM) technique is one of the most efficient methods; the nc-AFM detects changes in the resonant frequency (f 0 ) of an AFM cantilever induced by a weak interaction between a tip apex and surface atoms. [22] The method was able of giving directly insights into the buckling of silicene phases on Ag(111) [23][24][25] and how the interaction of the tip can modify this buckling. [25] The tipsample interactions can be separated into conservative and nonconservative forces using in-phase and 90° out-of-phase responses of the cantilever oscillation. [26] The frequency shift (Δf) is associated to the conservative forces and it is used to generate topographic images by recording the position of the tip while scanning and keeping Δf constant. On the other hand, nonconservative forces can originate from a hysteresis loop in the force-distance curve. [27] The resulting energy loss at each cycle is compensated in such a way that the oscillation amplitude is kept constant by a feedback loop. The variation of excitation energy output from the feedback loop, with respect to that of the tip far from the surface, called the energy dissipation, is mapped and gives the dissipation image. [28][29][30][31][32][33][34] In the atomic-resolution nc-AFM measurement, topography, and dissipation images are simultaneously recorded which allows for analyzing the interaction at atomic scale and evaluating the mechanical response of surface atoms.In this study, we applied the nc-AFM to epitaxial silicene on ZrB 2 thin films. Doing so, we reveal the specific nanomechanical properties resulting from the flexible buckled structure of silicene and the epitaxial conditions. These experiments Silicene, the graphene-like allotrope of silicon, has a great potential for the development of novel silicon-based nanotechnologies. Its unique buckling makes the atomic structure of this silicon 2D material particularly flexible and tunable. The nanomechanical properties of silicene are investigated by probing ep...

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“…The frequency and demodulated amplitude are recorded using the PLL during the ring-down cycle. The sensor achieves a quality factor of 4.32 × 10 6 , which represents a 100-fold improvement over state-ofthe-art QTF sensors [13]. In addition, the relative frequency noise is on the order of 10 −8 for a bandwidth of 1 Hz.…”

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confidence: 95%

A self-calibrating optomechanical force sensor with femtonewton resolution

Melcher

Stirling

Cervantes

et al. 2014

Applied Physics Letters

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We report the development of an ultrasensitive optomechanical sensor designed to improve the accuracy and precision of force measurements with atomic force microscopy. The sensors reach quality factors of 4.3 × 10 6 and force resolution on the femtonewton scale at room temperature. Self-calibration of the sensor is accomplished using radiation pressure to create a reference force. Self-calibration enables in situ calibration of the sensor in extreme environments, such as cryogenic ultra-high vacuum. The senor technology presents a viable route to force measurements at the atomic scale with uncertainties below the percent level.

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Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy

Cited by 19 publications

References 16 publications

Building a Scanning Probe Microscope Using Open Source Control Software and Systems

Building a Scanning Probe Microscope Using Open Source Control Software and Systems

Nanomechanical Properties of Epitaxial Silicene Revealed by Noncontact Atomic Force Microscopy

A self-calibrating optomechanical force sensor with femtonewton resolution

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