Resonance Ultrasonic Vibrations for in-line crack detection in silicon wafers and solar cells

Monastyrskyi, Andrii; Ostapenko, S.; Polupan, O.; Maeckel, H; Vazquez, Miguel

doi:10.1109/pvsc.2008.4922742

Cited by 10 publications

(9 citation statements)

References 5 publications

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“…The deviation from the peak and the broadening or narrowing of bandwidth of the spectrum indicates defects in the wafer. This is illustrated in Figure 16, as reported by Monastyrskyi et al (2008) for two identical 125-mm sized Czochralski silicon wafers. Specifically, the crack in the wafer shows the following features: 1) a frequency shift of the peak position; 2) an increase of the bandwidth; and 3) a reduction of the amplitude.…”

Section: Micro-crack Inspection In Solar Wafers/cellssupporting

confidence: 55%

“…The most common methods that have been investigated include laser beam induced current (LBIC) (Carstensen et al, 2003; Sites and Nagle, 2005; Vorster and Dyk, 2007; Zook, 1980), electron beam induced current (EBIC) (Brietenstein et al, 2008; Kittler et al, 1999; Meng et al, 2010), optical testing such as photoluminescence (PL) (Giesecke et al, 2011; Trupke et al, 2006a, 2006b), electroluminescence imaging (Fuyuki and Kitiyanan, 2009), radiometric pulse or thermal imaging (Dunlop and Halton, 2004), and Hyper spectral imaging (Li et al, 2010). Meanwhile other promising techniques such as ultrasonic vibration (Belyaev et al, 2006; Dallas et al, 2007; Monastyrskyi et al, 2008), electrical characterization (Konovalov et al, 1997), and infrared lock in ultrasound thermography (Rakotoniaina et al, 2004) will also be discussed. In this paper, all the aforementioned methods will be reviewed, highlighting some of their salient characteristics including merits and demerits.…”

Section: Micro-crack Inspection In Solar Wafers/cellsmentioning

confidence: 99%

“…Silicon wafer/cell with crack can be separated from a regular wafer. Reproduced with kind permission from the IEEE (Monastyrskyi et al, 2008). …”

Section: Micro-crack Inspection In Solar Wafers/cellsmentioning

confidence: 99%

See 2 more Smart Citations

Automatic detection of micro-crack in solar wafers and cells: a review

Israil

Anwar

Abdullah

2012

Transactions of the Institute of Measurement and Control

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This paper presents a review of the machine detection systems for micro-crack inspection of solar wafers and cells. To-date, there are various methods and procedures that have been developed at various laboratories around the world to inspect solar wafers and solar cells for manufacturing defects. This paper on micro-crack detection offers a comprehensive and an up-to-date review of different detection strategies, describing the main features of each technique together with its strengths as well as weaknesses. This paper will benefit researchers and practitioners, especially those who want to develop automatic inspection systems for inspecting solar wafers or solar cells for micro-cracks.

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Section: Micro-crack Inspection In Solar Wafers/cellssupporting

confidence: 55%

Section: Micro-crack Inspection In Solar Wafers/cellsmentioning

confidence: 99%

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Automatic detection of micro-crack in solar wafers and cells: a review

Israil

Anwar

Abdullah

2012

Transactions of the Institute of Measurement and Control

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“…In order to detect cracks and micro-cracks (u-cracks) in cells, a technique based on the analysis of the ultrasonic vibrations that follow an excitation can be used (Dallas et al, 2007;Monastyrskyi et al, 2008). This technique detects deviations in the characteristic frequency of the response after an ultrasonic excitation of the wafer.…”

Section: Resonance Ultrasonic Vibrations (Kuv) Techniquementioning

confidence: 99%

Early degradation of silicon PV modules and guaranty conditions

et al. 2011

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The fast growth of PV installed capacity in Spain has led to an increase in the demand for analysis of installed PV modules. One of the topics that manufacturers, promoters, and owners of the plants are more interested in is the possible degradation of PV modules. This paper presents some findings of PV plant evaluations carried out during last years. This evaluation usually consists of visual inspections, I-Vcurve field measurements (the whole plant or selected areas), thermal evaluations by IR imaging and, in some cases, measurements of the I-V characteristics and thermal behaviours of selected modules in the plant, chosen by the laboratory. Electroluminescence technique is also used as a method for detecting defects in PV modules. It must be noted that new defects that arise when the module is in operation may appear in modules initially defect-free (called hidden manufacturing defects). Some of these hidden defects that only appear in normal operation are rarely detected in reliability tests (IEC61215 or IEC61646) due to the different operational conditions of the module in the standard tests and in the field (serial-parallel connection of many PV modules, power inverter influence, overvoltage on wires, etc.).

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“…3. It is illustrative to show here that other imaging techniques based on photo-or electroluminescence in some cases give false positive results with regards to cracks [8]. The reason is that different surface features such as scratches may be easily identified as cracks with the imaging software.…”

Section: Case Study Amentioning

confidence: 88%

Yield enhancement for solar cell manufacturing using resonance Ultrasonic vibrations inspection

Belyaev

Émirov

Ostapenko

et al. 2009

2009 34th IEEE Photovoltaic Specialists Conference (PVSC)

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Resonance Ultrasonic vibrations (RUV) methodology was developed and applied to access mechanical quality of crystalline silicon wafers and solar cells. RUV approach is based on fast non-destructive measurement of specific resonance vibration mode generated in the tested object using external ultrasonic transducer. Crack introduced into the object alters the resonance properties of the mode and allows sensitive diagnostics of the crack appearance. The paper describes our recent results of applying RUV method at industrial environment with objective to reduce a breakage rate in solar cell and solar module lines.

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Resonance Ultrasonic Vibrations for in-line crack detection in silicon wafers and solar cells

Cited by 10 publications

References 5 publications

Automatic detection of micro-crack in solar wafers and cells: a review

Automatic detection of micro-crack in solar wafers and cells: a review

Early degradation of silicon PV modules and guaranty conditions

Yield enhancement for solar cell manufacturing using resonance Ultrasonic vibrations inspection

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