We reveal resonant reflection in a microstrip system with an iris and a short-circuit plunger for distances between the iris and the plunger that are much less than the wavelength in the transmission line. It is shown that the studied system can be used for design of novel microwave devices, including semiconductor ones, with controllable characteristics and decreased sizes.When designing waveguide systems, it is usually assumed that they ensure propagation conditions only for the fundamental wave. The same assumption is used when designing devices with resonant characteristics (an inductive rod with a capacitive gap, a resonant iris, etc.). Such devices are widely used in practice, e.g., for designing semiconductor microwave devices intended for operation at high-power levels.Analyzing the physical features of operation of such devices, it is usually noted that the fundamental-wave field can significantly be distorted in the vicinity of a nonuniformity (a rod or an iris), which is related to excitation of rapidly attenuated higher-order waves. At the same time, the role of the near field in the vicinity of a nonuniformity can be significant if, e.g., a reflecting plate is located in the neighborhood of the nonuniformity. In particular, in [1, 2], resonant phenomena in a waveguide system containing a capacitive iris and a short-circuit plunger were described. The appearance of resonances was observed for a distance of about λ W /100 between the iris and the short-circuit plunger, where λ W is the wavelength in a waveguide [1,2].The purpose of the present paper is to study possibilities of the appearance of such resonant reflection characteristics in a microstrip system. Figure 1 shows a sketch of the proposed microstrip analog of the waveguide systems described in [1,2] . The dimensions of dielectric substrate 1 of the microstrip line are Fig. 1.