Resonant Electron Transfer in Ionic Fluorine Compounds Following<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>1</mml:mn><mml:mi>s</mml:mi><mml:mi /><mml:mn>2</mml:mn><mml:mi>p</mml:mi></mml:math>Ionization

Benka, O.; Watson, R. L.; Kenefick, R.A.

doi:10.1103/physrevlett.47.1202

Cited by 58 publications

(16 citation statements)

References 11 publications

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“…The bonding in the rare earth fluorides and any other fluoride might be expected to have ionic character and yet the spectra of the lowest atomic number rare earth fluorides show virtually no shake-off peaks. A similar phenomenon was described by Benka 12 and Urch, 13 who noted exceptionally weak satellite F K˛3 ,4 lines in KF and SrF 2 in spite of strong ionicities. Urch has proposed a temporary covalence in which the generation of a vacancy in the F 1s level approximately aligns the energies of the F 2p orbital and an outer orbital of the cation.…”

Section: The Rae Peak Shift In the Rare Earth Fluoridessupporting

confidence: 65%

Extended x‐ray emission fine structure and high‐energy satellite lines state measured by electron probe microanalysis

Takahashi

Harrowfield

MacRae

et al. 2001

Surface & Interface Analysis

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The Ka satellite or shake-off lines can be observed by wavelength-dispersive spectrometry on the highenergy side of the main Ka peak. Occasionally, chemical state analysis of an emitting atom has been attempted using the shape and position of these lines. Recent extensive theory and experiment have shown that it is fruitful to take a similar approach using extended x-ray emission fine structure (EXEFS) arising from the radiative Auger effect (RAE). This fine structure is found in a low-intensity spectrum on the low-energy side of the Ka peak.We have studied the RAE spectra of the Ka lines of the elements F through to Ca by EPMA. The RAE peaks have energies close to the KLL energies of Auger transitions. In the lighter elements in this series, it was found that the difference between Ka and the RAE peak energies becomes quite small. For elements lighter than fluorine, it is difficult to observe the RAE peaks because they are overlapped by the main Ka line. At the higher energy end of the series, the intensity of the RAE lines becomes very small. The utility of the RAE lines for state analysis is limited, in practice, to the elements F through to Ca. The extended x-ray emission fine structure (EXEFS) of the RAE spectra has been used to calculate local bonding parameters.Both shake-off and RAE spectra associated with the F Ka line have been studied experimentally in the rare earth fluorides. The KLL RAE moves to lower energy as the atomic number of the rare earth cation increases. This has been confirmed theoretically by calculating electron energies using discrete variational Xa molecular orbital theory. The shake-off peaks increase in intensity relative to the main Ka peak because atomic number increases, contrary to expectation. It is considered that this could be due to temporary covalency. The EXEFS of the RAE spectra has been used to calculate local bonding parameters.

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Section: The Rae Peak Shift In the Rare Earth Fluoridessupporting

confidence: 65%

Extended x‐ray emission fine structure and high‐energy satellite lines state measured by electron probe microanalysis

Takahashi

Harrowfield

MacRae

et al. 2001

Surface & Interface Analysis

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“…Some reports have examined the origin of the satellite peaks in EPMA, XPS (including Auger electron spectroscopy, AES), PIXE, and XRF spectra for fluorine [7][8][9][10][11][12][13]. Those studies have implied that the satellite peak is related to X-ray emission from a multiply ionized atom.…”

Section: Introductionmentioning

confidence: 99%

“…Furthermore, some satellite peaks that include the information about the element chemical state are detectable in the spectra. Many investigations of chemical effects on EPMA, XRF, and PIXE spectra have been reported [1][2][3][4][5][6][7][8][9][10][11][12][13][14]. X-ray photoelectron spectroscopy (XPS) is another method for analyzing the chemical state of the emitting atom on the sample surface in an atomic scale [14].…”

Section: Introductionmentioning

confidence: 99%

“…X-ray emission spectra induced by an electron beam (electron probe microanalysis, EPMA), X-ray (X-ray fluorescence spectroscopy, XRF), or ion beam (particle induced X-ray emission, PIXE) have been applied to qualitative and quantitative analyses and chemical state analysis for solid samples [1][2][3][4][5][6][7][8][9][10][11][12][13][14]. The profile of the characteristic X-ray of an element is measured to calculate its content from the peak intensity.…”

Section: Introductionmentioning

confidence: 99%

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Chemical state analysis of fluorine in various compounds using X-ray fluorescence spectra

Nishibu

Yonezawa

Takashima

2005

Journal of Fluorine Chemistry

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“…As seen from the satellite intensity values, we do not observe any significant chemical sensitivity with the proton-beam excitation. However, literature reports suggest that with heavier projectiles chemical information can be obtained in some cases from the satellite intensities [40,41].…”

Section: Chemical Shifts Intensity Ratios and Satellite Peaks Inmentioning

confidence: 99%

Broadband Ultrahigh-Resolution Spectroscopy of Particle-Induced X Rays: Extending the Limits of Nondestructive Analysis

et al. 2016

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Nondestructive analysis (NDA) based on x-ray emission is widely used, for example, in the semiconductor and concrete industries. Here, we demonstrate significant quantitative and qualitative improvements in broadband x-ray NDA by combining particle-induced emission with detection based on superconducting microcalorimeter arrays. We show that the technique offers great promise in the elemental analysis of thin-film and bulk samples, especially in the difficult cases where tens of different elements with nearly overlapping emission lines have to be identified down to trace concentrations. We demonstrate the efficiency and resolving capabilities by spectroscopy of several complex multielement samples in the energy range 1-10 keV, some of which have a trace amount of impurities not detectable with standard silicon drift detectors. The ability to distinguish the chemical environment of an element is also demonstrated by measuring the intensity differences and chemical shifts of the characteristics x-ray peaks of titanium compounds. In particular, we report measurements of the Kα=Kβ intensity ratio of thin films of TiN and measurements of Ti Kα satellite peak intensities in various Ti thin-film compounds. We also assess the detection limits of the technique, comment on detection limits possible in the future, and discuss possible applications.

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Resonant Electron Transfer in Ionic Fluorine Compounds Following1s2pIonization

Cited by 58 publications

References 11 publications

Extended x‐ray emission fine structure and high‐energy satellite lines state measured by electron probe microanalysis

Extended x‐ray emission fine structure and high‐energy satellite lines state measured by electron probe microanalysis

Chemical state analysis of fluorine in various compounds using X-ray fluorescence spectra

Broadband Ultrahigh-Resolution Spectroscopy of Particle-Induced X Rays: Extending the Limits of Nondestructive Analysis

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