2016
DOI: 10.1088/1367-2630/18/5/053042
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Resonant optical gradient force interaction for nano-imaging and -spectroscopy

Abstract: The optical gradient force provides optomechanical interactions, for particle trapping and manipulation, as well as for near-field optical imaging in scanning probe microscopy. Based on recent spectroscopic experiments, its extension and use for a novel form of chemical scanning probe nanoimaging was proposed. Here, we provide the theoretical basis in terms of spectral behavior, resonant enhancement, and distance dependence of the optical gradient force from numerical simulations in a coupled nanoparticle mode… Show more

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Cited by 45 publications
(61 citation statements)
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References 61 publications
(111 reference statements)
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“…Because modeling of the full three-dimensional problem near the tip-sample junction is costly, simplifications are required to retrieve the essential physics at play. In a recent study, the photo-induced force was evaluated through the MST for an idealized spherical tip apex in a full wave simulation [19]. This approach intrinsically includes multiple scattering mechanism between the tip and its image dipole or between the tip and an isolated particle.…”
Section: Introductionmentioning
confidence: 99%
“…Because modeling of the full three-dimensional problem near the tip-sample junction is costly, simplifications are required to retrieve the essential physics at play. In a recent study, the photo-induced force was evaluated through the MST for an idealized spherical tip apex in a full wave simulation [19]. This approach intrinsically includes multiple scattering mechanism between the tip and its image dipole or between the tip and an isolated particle.…”
Section: Introductionmentioning
confidence: 99%
“…Many mechanisms have been involved in developing this new type of scanning probe technique for material identifications. As we introduced in the theoretical section, optical-induced forces can arise from gradient optical forces, scattering forces (radiation pressure), and/or absorption-induced forces [48]. A series of optical force-based microscopy techniques have recently been developed, including photo-induced force microscopy (PiFM -that mainly detects gradient force and radiation pressure), chiral optical force microscopy (COFM -that detects the gradient forces in conjunction with electromagnetic polarizabilities of the sample), photo-expansion microscopy or photo-thermal induced resonance (PTIR and AFM-IR -that detect absorption-induced forces), etc.…”
Section: Experimental Realization Of Scanning Probe Techniques Utilizmentioning
confidence: 99%
“…When gradient force and radiation pressure dominate, as shown in Figure 1A, optical forces acting on an AFM tip consist of two parts: an attractive force given by the photoinduced dipole and a repulsive force given by radiation pressure [26,48,49,51],…”
Section: Pifmmentioning
confidence: 99%
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“…38,40 The spectral profile of the optical force is also expected to track the absorption spectrum in plasmonic structures. 41,44 Here, we measure photoinduced forces in atomically thin layers of MoS 2 and WS 2 flakes on glass substrates using a modified commercial AFM. MoS 2 and WS 2 are both TMDs with a direct-to-indirect bandgap transition and characteristic excitonic peaks in the visible region of the optical spectrum.…”
mentioning
confidence: 99%