2015
DOI: 10.1103/physrevb.92.104430
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Respective influence of in-plane and out-of-plane spin-transfer torques in magnetization switching of perpendicular magnetic tunnel junctions

Abstract: International audienceThe relative contributions of in-plane (damping-like) and out-of-plane (field-like) spin-transfer torques (STT) in the magnetization switching of out-of-plane magnetized magnetic tunnel junctions (pMTJ) has been theoretically analyzed using the transformed Landau-Lifshitz-Gilbert (LLG) equation with the STT terms. It is demonstrated that in a pMTJ structure obeying macrospin dynamics, the out-of-plane torque influences the precession frequency, but it does not contribute significantly to … Show more

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Cited by 36 publications
(26 citation statements)
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“…We emphasize this point, because the state diagram of Fig. 3(a) with linear and parallel switching frontiers is sometimes interpreted as an indication of macrospin behavior 10 .…”
Section: Discussionmentioning
confidence: 98%
“…We emphasize this point, because the state diagram of Fig. 3(a) with linear and parallel switching frontiers is sometimes interpreted as an indication of macrospin behavior 10 .…”
Section: Discussionmentioning
confidence: 98%
“…The procedure for VH stability diagram measurements is similar to that described in Ref. [20]. A single pMTJ pillar was wire bonded and placed in a physical properties measurement system (PPMS) on a sample rotator.…”
Section: Experimental Stability Diagramsmentioning
confidence: 99%
“…In this work, instead of measuring the device resistance-magnetic field (R-H) loops at constant writing pulse amplitude, as in Ref. [20], we measured a device resistance-writing pulse voltage (R-V) loops at each magnetic field point. Within each R-V loop, a sequence of writing pulses with continuously changing amplitude was applied and after each writing pulse the resistance of the pMTJ pillar was measured by applying a small bias current (∼1 µA).…”
Section: Experimental Stability Diagramsmentioning
confidence: 99%
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“…Smaller values of attempt time are also sometimes reported, for example τ 0 = 0.1 ns. 17 Increasing (decreasing) the value of τ 0 to 10 ns (0.1 ns) would increase (decrease) the value of n needed to match the simulated data by ∼ 5%. Since typical values of τ 0 are 0.1 ns to 1 ns, this cannot be used to adjust the value of n to be equal to 2.…”
Section: Resultsmentioning
confidence: 99%