2023
DOI: 10.1088/1402-4896/acaeec
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Response embedded atom model potential of Pb at finite temperature: application on the dislocation mobility

Abstract: Dislocation is a major carrier of plastic deformation for metal materials and are crucial. Understanding the mechanism of dislocation motion is beneficial for understanding the plastic deformation of materials under dynamic loading. In this work, a new response EAM (REAM) potential is developed for the applications under high pressure and finite temperature conditions. We use the REAM potential to investigate the behaviors of edge and screw dislocations in Pb by molecular dynamics (MD) simulations, and compare… Show more

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Cited by 2 publications
(3 citation statements)
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“…Thereby, the dislocation moves through the motion of the two partial dislocations and the stacking fault between them. Due to the influence of internal stress fluctuation and external obstacles during the glide process, the stacking fault width will fluctuate [37]. If the applied stress is large enough, the width could change significantly, which will affect the dislocation glide velocity.…”
Section: Mobility Of the Edge Dislocation Under Different Vacancy Con...mentioning
confidence: 99%
See 2 more Smart Citations
“…Thereby, the dislocation moves through the motion of the two partial dislocations and the stacking fault between them. Due to the influence of internal stress fluctuation and external obstacles during the glide process, the stacking fault width will fluctuate [37]. If the applied stress is large enough, the width could change significantly, which will affect the dislocation glide velocity.…”
Section: Mobility Of the Edge Dislocation Under Different Vacancy Con...mentioning
confidence: 99%
“…In addition, the slope of the dislocation position curve tends to be stable after 100 ps. As velocity is defined as the derivative of displacement with respect to time, it can be estimated using the slope of the displacement versus time curve of the dislocation after 100 ps when the dislocation motion is stable [37]. When the applied stress is in the range of 10-300 MPa, the position of edge dislocation for C v = 0% is positively correlated with time.…”
Section: Mobility Of the Edge Dislocation Under Different Vacancy Con...mentioning
confidence: 99%
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