1990
DOI: 10.1016/0168-9002(90)90777-4
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Response of Si detectors to electrons, deuterons and alpha particles

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Cited by 33 publications
(7 citation statements)
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“…More generally, it applies to every peak which interferes with the tailing of a higher-energy peak and vice versa. Also, the uncertainties assigned to mathematical corrections for summing-in and summing-out effects should be propagated by equation (11).…”
Section: Constraintsmentioning
confidence: 99%
See 1 more Smart Citation
“…More generally, it applies to every peak which interferes with the tailing of a higher-energy peak and vice versa. Also, the uncertainties assigned to mathematical corrections for summing-in and summing-out effects should be propagated by equation (11).…”
Section: Constraintsmentioning
confidence: 99%
“…Alpha spectrometry with silicon detectors is also imperfect with respect to linearity between pulse height and particle energy [11]. Underlying reasons are that energy loss in dead layers varies with the particle's energy and the required energy for creating an electron-hole pair depends on the stopping power [12].…”
Section: Introductionmentioning
confidence: 99%
“…The nonlinear response of silicon detectors to alpha particle absorption was used to correct these spectra [29], [30]. The particle energy, , which is effectively converted to electron-hole pairs, is where the initial kinetic energy of the alpha particle is , the energy absorbed by the source is , the energy absorbed by the aluminum window is , and the energy deposited in the silicon lattice is .…”
Section: Transfer Characteristic and Homogeneitymentioning
confidence: 99%
“…Following Ref. [46], the calibrated energies were corrected for the detector dead layer, nonionizing energy losses (NIELs), and the silicon energy-response non-linearity [46,47]. The datacollection system non-linearity was also accounted for [48].…”
mentioning
confidence: 99%
“…α-energy calibration-The largest contributions arise from several energy corrections during the calibration process: energy lost through the 100-nm-thick DSSD dead layer, fitted distributions of the NIEL generated in TRIM [59], and the measured silicon energy-response non-linearity parameters (uncertainties taken from Refs. [47,60]). The combined systematic uncertainty of |C T /C A | 2 for the α-energy calibration is 0.0007.…”
mentioning
confidence: 99%