Restrictive antenna rules limiting PID degradation for MOS transistors with connected MIM-capacitors

Martin, Andreas; Pham, Phi-Long; Nielen, Heiko; Feil, Maximilian W.

doi:10.1109/iirw59383.2023.10477710

2023 IEEE International Integrated Reliability Workshop (IIRW) 2023

DOI: 10.1109/iirw59383.2023.10477710

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Restrictive antenna rules limiting PID degradation for MOS transistors with connected MIM-capacitors

Andreas Martin,

Phi-Long Pham,

Heiko Nielen

et al.

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Restrictive antenna rules limiting PID degradation for MOS transistors with connected MIM-capacitors

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References 17 publications

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