Results of Space Experiments: CRRES

Mullen, E.G.; Gussenhoven, M. S.

doi:10.1007/978-94-011-2048-7_25

Cited by 9 publications

(3 citation statements)

References 20 publications

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“…Several types of samples were flown aboard the CRRES satellite [17] as part of a study of charging induced arcing [18]. The samples were the subject of detailed resistivity tests using the charge storage method [19] and very successful modeling of their pulsing history during the CRRES flight [12,20].…”

Section: A Sample Selection For Materials Studiesmentioning

confidence: 99%

Charge-Enhanced Contamination and Environmental Degradation of MISSE-6 SUSpECS Materials

Dennison

Evans

Fullmer

et al. 2012

IEEE Trans. Plasma Sci.

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The effects of prolonged exposure to the LEO space environment and charge-enhanced contamination on optical, thermal, and electron emission and transport properties of common spacecraft materials have been investigated by comparing pre-and post-flight characterization measurements. The State of Utah Space Environment and Contamination Study (SUSpECS) deployed in March 2008 on board the Materials International Space Station Experiment (MISSE-6) payload, was exposed for ~18 months on the exterior of the International Space Station (ISS), and was retrieved in September 2009. A total of 165 samples were mounted on three separate SUSpECS panels on the ram and wake sides on the ISS. Some samples, particularly those exposed to atomic oxygen in the ram direction, showed pronounced effects due to exposure. Biased samples for the charge-enhanced contamination study showed subtle variations in visible and infrared reflectivity.

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Section: A Sample Selection For Materials Studiesmentioning

confidence: 99%

Charge-Enhanced Contamination and Environmental Degradation of MISSE-6 SUSpECS Materials

Dennison

Evans

Fullmer

et al. 2012

IEEE Trans. Plasma Sci.

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“…The majority of the test samples have already undergone pre-flight analysis during an ongoing seven year study of the electron emission [7][8][9][10][11] and resistivity properties [7], [12][13][14][15] of spacecraft materials sponsored by the NASA Space Environments and Effects Program. Preliminary ground-based studies at USU have shown that contamination can produce dramatic changes in electron emission that can lead to severe charging effects under certain circumstances [16] A preliminary study of the effects of contamination of resistivity using the charge storage method is underway at USU.…”

Section: Sample Selection Criteriamentioning

confidence: 99%

“…Several types of samples were flown aboard the CRESS satellite [15] as part of a study of spacecraft charging induced arcing [17]. The samples have recently been subjected to detailed resistivty tests using the charge storage method [18] and very successful modeling of their pulsing history during the CRESS flight [12,19].…”

Section: Table I Suspecs Samplesmentioning

confidence: 99%

Flight Experiments on the Effects of Contamination on Electron Emission of Materials

Dennison

Hodges

Duce

et al. 2009

1st AIAA Atmospheric and Space Environments Conference

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We report on a study of the effects of prolonged exposure to the space environment and of chargeenhanced contamination on the electron emission and resistivity of spacecraft materials. The State of Utah Space Environment & Contamination Study (SUSpECS) was deployed on the International Space Station (ISS) in March 2008 onboard the MISSE-6 payload during STS-123. The Materials International Space Station Experiment (MISSE-6) program is designed to characterize the performance of candidate new space materials over the course of its ~17 month exposure to the LEO environment, with a target return date of August 2009 on STS-127. Approximately 165 samples are mounted on three separate SUSpECS panels in the ram and wake sides on the ISS. They have been carefully chosen to provide needed information for different ongoing studies and a broad cross-section of prototypical materials used on the exteriors of spacecrafts. Design of the sample panels are detailed, including a three tiered configuration intended to provide variable atomic oxygen and ultraviolet radiation exposure. The methods used to simulate charge enhanced contamination by actively biasing samples to low positive and negative voltages are also described. A primary emphasis of SUSpECS is the study of modifications to the electron emission resulting from exposure to the space plasma environment and to environmental contamination. There is presently little available data related to the effects of sample deterioration and contamination on emission properties for materials actually flown in space. Electron emission and transport properties of materials are key in determining the amount of charge build-up and the time for the charge to dissipate, as well as the likelihood of deleterious spacecraft charging effects. Such materials properties are essential parameters in modeling spacecraft charging with engineering tools like NASCAP-2K code. SUSpECS studies will test the validity of our predictions from ground-based studies that very thin layers of contamination can lead to severe charging effects under certain circumstance. Electron-, ion-, and photon-induced electron emission yield curves, crossover energies and emission spectra, as well as resistivity and dielectric strength, have been tested for most SUSpECS samples in their pristine conditions before flight. These measurements will be compared with post-flight measurements. Additional pre-and post-flight characterization measurements include optical and electron microscopy, reflection spectroscopy, emissivity and Auger electron spectroscopy.

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Microelectronics effects as seen on CRRES

Mullen¹,

Ray²

1994

Advances in Space Research

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Results of Space Experiments: CRRES

Cited by 9 publications

References 20 publications

Charge-Enhanced Contamination and Environmental Degradation of MISSE-6 SUSpECS Materials

Charge-Enhanced Contamination and Environmental Degradation of MISSE-6 SUSpECS Materials

Flight Experiments on the Effects of Contamination on Electron Emission of Materials

Microelectronics effects as seen on CRRES

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