1992
DOI: 10.1016/0168-9002(92)90192-7
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Results on the DELPHI microvertex alignment from a precise 3-D mapping

Abstract: The DELPHI microvertex has been carefully aligned for the 1990 period of data taking at LEP ete -collider using a multistep procedure. The first two steps are presented. Method and results of a precise mapping of the microvertex before the insertion in the DELPHI apparatus using a 3-D measurement machine are describec in detail. Secondly procedure and results of an alignment algorithm using the interaction tracks are presented.

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Cited by 4 publications
(2 citation statements)
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“…The internal alignment of the Silicon Tracker is based on a mechanical survey, during which the components and the whole structure were measured by optical or mechanical means. The survey was done in two steps [7]. First a measurement of each individual module was done to fix the position of a sensor within a module to a level of 1-2 µm.…”
Section: Internal Vd Alignmentmentioning
confidence: 99%
“…The internal alignment of the Silicon Tracker is based on a mechanical survey, during which the components and the whole structure were measured by optical or mechanical means. The survey was done in two steps [7]. First a measurement of each individual module was done to fix the position of a sensor within a module to a level of 1-2 µm.…”
Section: Internal Vd Alignmentmentioning
confidence: 99%
“…The survey stage [28] is di erent for the di erent detector components and it requires both optical and mechanical measurements. Barrel and ministrip modules are individually measured by a camera 11 mounted on the same 3D machine 12 used for the mechanical survey.…”
Section: Survey Of the Silicon Trackermentioning
confidence: 99%