Retardation characteristics and birefringence of a multiple-order crystalline quartz plate

Nagib, N.N.; Khodier, S.A.; Sidki, H. M.

doi:10.1016/s0030-3992(02)00147-0

Cited by 26 publications

(18 citation statements)

References 7 publications

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“…On the other hand, the wavelength dependence of the retardation based on the order of the retardation at a standard wavelength was estimated in Ref. [8]. As opposed to the large retardation, the present authors concentrate on a specimen with a tiny retardation.…”

Section: Introductionmentioning

confidence: 92%

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Semi-Automated Sènarmont Method for Measurement of Small Retardation

Mori

Tomita

2015

Instrumentation Science & Technology

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In usual measurement with the Sènarmont method using a conventional polarization microscope, the azimuth angle of the analyzer at extinction of the emerging light is detected by naked eyes. If the intensity of light is measured as a function of the azimuth angle of the analyzer, one can find the direction at which the intensity is minimized more accurately by fitting. However, this procedure requires much numbers of operations as compared to the usual method, and thus is time-consuming. To circumvent this problem a setting with which the intensity is measured as a function of the azimuth angle of the analyzer is constructed with rotation of the analyzer through a computer control. As a result, the time required for the measurement has been greatly decreased.

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Section: Introductionmentioning

confidence: 92%

“…Usually determination of the phase difference δ accompanies uncertainty of 2πm with m being an integer. Measurement of a retarder with |δ| larger than 2π was a subject of some recent studies [6,7,8] . A multicolor Sènarmont method, in which one could determine the order of the retardation by measurements alone, was employed in Refs.…”

Section: Introductionmentioning

confidence: 99%

Semi-Automated Sènarmont Method for Measurement of Small Retardation

Mori

Tomita

2015

Instrumentation Science & Technology

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“…A usual technique consists in inserting the retarder in between two linear polarizers, which are oriented at ±45°with respect to the retarder neutral axes. The system is illuminated with a light source with broadband spectrum, and the transmission is analyzed with a spectrometer [6][7][8][9][10]. The transmitted spectrum typically shows an oscillatory dependence with wavelength from which the spectral retardance function can be retrieved.…”

Section: Introductionmentioning

confidence: 99%

“…Here we apply the above mentioned technique of measuring the transmittance spectra between crossed or parallel polarizers to determine the spectral retardance function [6][7][8][9][10][11][12], but we use an optical calibration system developed for extending the measurement range to wavelengths from 450 nm to 1600 nm. The system incorporates a thermal broadband light source or a super-continuum laser, two broadband beam-splitter polarizers, and two spectrometers that operate in the VIS and in the NIR band regions respectively.…”

Section: Introductionmentioning

confidence: 99%

Optical system for measuring the spectral retardance function in an extended range

Messaadi

Sánchez-López

García‐Martínez

et al. 2016

J. Eur. Opt. Soc.-Rapid Publ.

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Background: Optical retarders are key elements for the control of the state of polarization of light, and their wavelength dependance is of great importance in a number of applications. Methods: We apply a well-known technique for determinig the spectral retardance by measuring the transmission spectra between crossed or parallel polarizers. But we we develop an optical system to perform this measurement in a wide spectral range covering the visible (VIS) and near infrared (NIR) spectrum in the range from 400 to 1600 nm. Results: As a result we can measure the spectral retardance of different retarders and easily identify the kind of reterder (multiple order, zero-order, achromatic). We show results with tunable liquid-crystal retarders as well, where the technique is applied to determine the spectral retardance as a function of the applied voltage. Finally, the accuracy of the technique is verified by the generation of a birefringent spectral filter. Conclusions: A technique to measure the spectral retardance of a linear retarder in a wide spectral range is applied to identify different types of retarders, and provide an accurate description of the spectral polarization conversion properties of these elements.

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“…For a long time, inorganic materials like mica, quartz, magnesium fluoride (MgF 2 ) and sapphire (Al 2 O 3 ) are extensively used to Contents lists available at ScienceDirect journal homepage: www.elsevier.com/locate/optlastec fabricate wave plate [11][12][13]. After the recent progress achieved in the synthetic single crystal growth techniques, it is now available to grow different types of high quality single crystals.…”

Section: Introductionmentioning

confidence: 99%

Wide spectral range multiple orders and half-wave achromatic phase retarders fabricated from two lithium tantalite single crystal plates

Emam-Ismail

2015

Optics & Laser Technology

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Retardation characteristics and birefringence of a multiple-order crystalline quartz plate

Cited by 26 publications

References 7 publications

Semi-Automated Sènarmont Method for Measurement of Small Retardation

Semi-Automated Sènarmont Method for Measurement of Small Retardation

Optical system for measuring the spectral retardance function in an extended range

Wide spectral range multiple orders and half-wave achromatic phase retarders fabricated from two lithium tantalite single crystal plates

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