2016
DOI: 10.1016/j.nme.2016.04.008
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Retention in tungsten resulting from extremely high fluence plasma exposure

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Cited by 37 publications
(24 citation statements)
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“…A fit to these data is also shown as the red line in Figure 4. As discussed elsewhere [36], the retention probability decreases significantly as the material temperature during plasma exposure is increased.…”
Section: Discussionmentioning
confidence: 70%
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“…A fit to these data is also shown as the red line in Figure 4. As discussed elsewhere [36], the retention probability decreases significantly as the material temperature during plasma exposure is increased.…”
Section: Discussionmentioning
confidence: 70%
“…Using these data, and taking ptrap to be given then by the ratio of the retained D inventory to the total ion fluence to the surface, we can then examine the evolution of ptrap, vs. plasma ion fluence. Figure 4 shows this result for several types of plasma--exposed W. The open red circles show ptrap, vs. plasma ion fluence for undamaged W exposed to D plasmas in PISCES plasmas, where the W samples were held at 643 K. A detailed description of these PISCES exposures is available elsewhere [36]. These data show a precipitous drop in ptrap with increased plasma fluence, presumably due to the fact that as the fluence is raised, the near--surface intrinsic traps become saturated with D. The resulting saturated near--surface region is then more likely to release D back to the plasma, thereby reducing ptrap.…”
Section: Discussionmentioning
confidence: 99%
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“…Only in recent experiments at PISCES-B W targets were exposed to a deuterium (D) plasma to fluences up to 210 28 D/m 2 . However, the exposures were carried out only at one temperature of 640 K and the surface modifications of the exposed targets were not studied in detail [20].…”
Section: Introductionmentioning
confidence: 99%