2012
DOI: 10.1016/j.optlaseng.2012.06.011
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Retrieving the relief of a low-roughness surface using a two-step interferometric method with blind phase shift of a reference wave

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Cited by 24 publications
(2 citation statements)
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“…Phase shifts of up to π rad are possible. Blind phase-shifting interferometry can be used in metrology applications to generate high-resolution phase maps with less noise [21][22][23]. In this study, phase maps are extracted from a single interferogram to study the relative scattering of vortex and non-vortex beams through milk samples.…”
Section: Thermo-optic Refraction Interferometer (Tori)mentioning
confidence: 99%
“…Phase shifts of up to π rad are possible. Blind phase-shifting interferometry can be used in metrology applications to generate high-resolution phase maps with less noise [21][22][23]. In this study, phase maps are extracted from a single interferogram to study the relative scattering of vortex and non-vortex beams through milk samples.…”
Section: Thermo-optic Refraction Interferometer (Tori)mentioning
confidence: 99%
“…Сьогодні розроблено низку дво-і трикрокових фазозсувних методів і алгоритмів, у яких фазові зсуви є довільними в певному кутовому інтервалі (наприклад, від 0 до π) [7][8][9]. Для їхньої реалізації не потрібне калібрування ФЗЕ і, отже, використання каліброва-них комерційних ФЗП.…”
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