2010 28th VLSI Test Symposium (VTS) 2010
DOI: 10.1109/vts.2010.5469570
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Reusing NoC-infrastructure for test data compression

Abstract: Previous work on testing NoC-based systems has shown that the integrated network can be efficiently reused as test access mechanism (TAM). These approaches exploit the given infrastructure for data transportation. Beyond that, NoC-architectures for nanoscale systems also have to ensure a reliable communication by additional hardware and/or software measures. For example a cyclic redundancy check (CRC) may be added to protect the end-to-end communication between network resources. This paper presents an approac… Show more

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Cited by 5 publications
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