Defect tolerance has been often invoked during the past years to explain the surprising optimal device performance despite the fact we are dealing with a material which can self-assemble at low temperature and is mainly based on ionic bonds. We believe there is not a unique explanation for such observation. One way to understand this phenomenon is understanding the nature of carriers and how they are transported across thin films. So far, there is a general consensus on the nature of photo-carriers, defined as large polarons in 3D perovskites. [9] There have been reports suggesting that such large polarons would be able to screen the carrier-carrier and carrier-defect scattering, thus contributing to the long lifetime of the carriers. [10] Nevertheless, the carrier transport mechanism has not been elucidated yet and the debate on the role of a soft lattice, low energy phonons, and electron-phonon interaction on the screening from defects is still lively. The other side of the medal is looking at the nature of defects and how they will influence the carriers dynamics. We are aware that in perovskite thin films the formation of defects may be strongly influenced by the preparation of perovskite precursors, their processing, crystallization, post treatment procedures and even device operation. Theoretical studies can help to take the right path and understand the intrinsic properties/behaviors of defects. For a first screening on the role of defects on the primary optoelectronic properties of a semiconductor, one has to gather information regarding the probability of forming such defects, the thermodynamic ionization levels of the electronic states they form, and how probable the capture of carriers occurs through an evaluation of the capture cross-section. Density functional theory (DFT) calculations indicate that point defects with the lowest formation energy, mainly vacancies, generally introduce shallow trap states (Figure 1a). For many semiconductors the CB and VB have an antibonding and bonding character. Such a property can bring about deep defect states in the bandgap when an atom is removed. [11] However, in metal-halide perovskites CB and VB both exhibit antibonding character. In MAPbI 3 (MA = CH 3 NH 3 +), VB and CB edges are generated from the interaction between Pb 6s and I 5p orbitals, and Pb 6p and I 5p orbitals, respectively. [12,13] Strong antibonding coupling between Pb 6s orbital and I 5p orbital expands VB bandwidth and raises VB edge, suggesting that most defect states are located within or closer to VB edge. On the other Metal-halide perovskites present exceptional optoelectronic properties such as large light absorption coefficients, long free charge carrier diffusion lengths with ambipolar character. They are apparently protected by what is often described as a "defect tolerance" which has allowed to achieve, relatively quickly, highly performing devices. Nevertheless, there also exists a "defect intolerance" when it is dealt with stability. Further rationalization of the passivation strategi...