2021
DOI: 10.3390/ma14102678
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Reversible Barrier Switching of ZnO/RuO2 Schottky Diodes

Abstract: The current-voltage characteristics of ZnO/RuO2 Schottky diodes prepared by magnetron sputtering are shown to exhibit a reversible hysteresis behavior, which corresponds to a variation of the Schottky barrier height between 0.9 and 1.3 eV upon voltage cycling. The changes in the barrier height are attributed to trapping and de-trapping of electrons in oxygen vacancies.

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Cited by 5 publications
(5 citation statements)
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“…Notably, the off/on ratio was determined by dividing the high current by the low current at ∼1.5 V (Figure f). Similar conduction behavior was reported for ZnO/RuO 2 where the hysteretic behavior under positive bias was attributed to diode leakage caused by surface conduction . However, in our case, the distinct electronic transition causing resistance switching occurs at the coercive voltage and, therefore, is linked to the reversal of the ferroelectric polarization.…”
Section: Resultssupporting
confidence: 87%
See 1 more Smart Citation
“…Notably, the off/on ratio was determined by dividing the high current by the low current at ∼1.5 V (Figure f). Similar conduction behavior was reported for ZnO/RuO 2 where the hysteretic behavior under positive bias was attributed to diode leakage caused by surface conduction . However, in our case, the distinct electronic transition causing resistance switching occurs at the coercive voltage and, therefore, is linked to the reversal of the ferroelectric polarization.…”
Section: Resultssupporting
confidence: 87%
“…Similar conduction behavior was reported for ZnO/RuO 2 where the hysteretic behavior under positive bias was attributed to diode leakage caused by surface conduction. 26 However, in our case, the distinct electronic transition causing resistance switching occurs at the coercive voltage and, therefore, is linked to the reversal of the ferroelectric polarization. Meanwhile, for the negative voltages, the resistance state stays high irrespective of polarization direction until the voltage reaches approximately −5.3 V at which the electrical current shows a sudden rise (arrow 2).…”
Section: ■ Introductionmentioning
confidence: 59%
“…[16] This is primarily attributed to their simple device structure, which allows for the adjustment of the Φ SBH . [14,15] A high Φ SBH has been found to be useful in reducing the dark current and thus enhancing detectivity. Nevertheless, typical Schottky photodiodes based on silicon have faced challenges in improving the metal diffusion at the contact interface of the Φ SBH .…”
Section: Introductionmentioning
confidence: 99%
“…Schottky‐barrier diodes (SBDs) are appealing for self‐powered and high‐speed photodiode applications due to their simple device architecture, inexpensive fabrication process, and small device capacitance. [ 1,2 ] Among various semiconductors, silicon (Si) plays an important role in fabricating SBD photodetectors for wavelength ranging from 0.4 to 1.1 µm due to the mature process technology and the potential for large‐scale integration of photodetector networks with readout circuits. [ 3,4 ] The device performance of Si‐based SBD photodetectors is fundamentally determined by the Schottky barrier height (Ф B ) between the metallic electrode and Si.…”
Section: Introductionmentioning
confidence: 99%
“…Schottky-barrier diodes (SBDs) are appealing for self-powered and high-speed photodiode applications due to their simple device architecture, inexpensive fabrication process, and small device capacitance. [1,2] Among various semiconductors, silicon (Si) plays an important role in fabricating SBD photodetectors for wavelength ranging from 0.4 to 1.1 µm due to the mature terminations. [15] The adjustable work function, along with the unique dangling bond-free properties, makes the MXenes very attractive to form van der Waals (vdW) Schottky junctions with Si for high-performance self-powered SBDs.…”
Section: Introductionmentioning
confidence: 99%