2021
DOI: 10.2320/matertrans.mt-m2021094
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Review of “12th Japanese-Polish Joint Seminar on Micro and Nano Analysis (August 29–September 1, 2018)”

Abstract: The main purpose of this seminar is to discuss the structural analysis of materials by electron microscopy techniques. Among the papers presented at the seminar, this article briefly reviews the following topics: observations of dislocations in a thick specimen by ultra-high voltage electron microscopy, suppression of geometric phase shift due to antiphase boundaries in dark-field electron holography, and structural characterization of amorphous materials by electron diffraction techniques.

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Cited by 3 publications
(2 citation statements)
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“…Owing to the short wavelength of high energy electrons, scattering information over a wide range of the reciprocal lattice space can be obtained utilizing electron diffraction. 18) Therefore, electron PDF analysis is an effective method for characterizing amorphous structures. It has been employed to study amorphous or polycrystal materials, such as Mg 2 F and Fe 100¹x B, using their ED patterns.…”
Section: Pdf Analysismentioning
confidence: 99%
“…Owing to the short wavelength of high energy electrons, scattering information over a wide range of the reciprocal lattice space can be obtained utilizing electron diffraction. 18) Therefore, electron PDF analysis is an effective method for characterizing amorphous structures. It has been employed to study amorphous or polycrystal materials, such as Mg 2 F and Fe 100¹x B, using their ED patterns.…”
Section: Pdf Analysismentioning
confidence: 99%
“…Readers can find that two special issues related to SEM and TEM analyses were published from Materials Transactions, of which studies were introduced in the CTR. 110,111) For an additional comment, one of the awarded papers dealt with direct reduction of TiO 2 3) and interested readers can find the related topic reviewed extensively in a latest CTR paper by Suzuki et al 112)…”
Section: Editor's Remarksmentioning
confidence: 99%