Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies

Sato, Keno; Ishida, Takashi; Okamoto, Toshiyuki; Ichikawa, Tamotsu; Wei, Jianglin; Nakatani, Takayuki; Zhao, Yujie; Katayama, Shogo; Yamamoto, Shûhei; Kuwana, Anna; Hatayama, Kazumi; Kobayashi, Haruo

doi:10.1109/itc50571.2021.00038

Cited by 6 publications

(6 citation statements)

References 1 publication

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“…5 AMS Circuit and System Testing Technologies AMS circuit and system testing technologies are important but their researchers are not so many in universities. Then we have been engaged in the research for them by collaborating with industry [109][110][111][112][113][114][115][116][117][118][119][120][121][122][123][124]. These are at the boundary between AMS circuit and LSI testing technologies.…”

Section: Mos Reference Current Sourcementioning

confidence: 99%

How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area

KOBAYASHI

2024

IEICE Trans. Fundamentals

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This article reviews the author's group research achievements in analog/mixed-signal circuit and system area with introduction of how they came up with the ideas. Analog/mixed-signal circuits and systems have to be designed as well-balanced in many aspects, and coming up ideas needs some experiences and discussions with researchers. It is also heavily dependent on researchers. Here, the author's group own experiences are presented as well as their research motivations.

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Section: Mos Reference Current Sourcementioning

confidence: 99%

How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area

KOBAYASHI

2024

IEICE Trans. Fundamentals

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“…The windowing method [21][22][23][24][25] is computationally efficient. However, this method needs the prior knowledge of window function selection, which involves a trade-off of several factors, such as the main lobe width, side-lobe decay rate and the largest side-lobe level.…”

Section: Adc Spectral Testingmentioning

confidence: 99%

“…If the coherent sampling condition cannot be met, the windowing method is widely used to reduce spectral leakage [21][22][23][24][25]. Engineers should know how to select an…”

Section: The Maximum Side-lobe Decay Windowsmentioning

confidence: 99%

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Research on Cosine-Sum Windows with Maximum Side-Lobe Decay for High Precision ADC Spectral Testing

Zhong

Song

et al. 2022

Electronics

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Achieving coherent sampling has always been a major challenge in analog-to-digital converter (ADC) spectral testing. If the coherent sampling condition cannot be met, leakage appears in the spectrum, which results in inaccurate parameters. The windowing method is widely used to process ADC data to eliminate leakage. However, this method requires prior knowledge about the type of window, and some commonly used windows cannot provide accurate results for a high precision ADC. In this paper, some general principles for optimizing the cosine-sum window and some windows with maximum side-lobe decay have been presented. A test method for eliminating the leakage caused by non-coherent sampling is also proposed. The proposed method can accurately evaluate the dynamic parameters of an ADC with arbitrary non-coherency. Various simulation results and measurement data demonstrate the functionality and robustness of the proposed method. The proposed method significantly relaxes the condition of coherent sampling and decreases the test cost.

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“…The spectral testing plays an important role in evaluating the dynamic parameters of analog-to-digital converter (ADC), such as Signal-to-Noise Ratio (SNR) and Spurious Free Dynamic Range (SFDR) [1,2,3,4,5,6]. However, as the performance of ADC continues to improve, the test requirements have become more stringent.…”

Section: Introductionmentioning

confidence: 99%

Accurate spectral testing algorithm of ADC with amplitude drift

Zhong

Song

et al. 2022

IEICE Electron. Express

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A new spectral testing algorithm is proposed to estimate the dynamic parameters accurately when the signal source suffers the amplitude drift. The output data of the Analog-to-Digital Converter (ADC) under test are divided into several segments. By estimating original fundamental via the Least squares method and reconstructing a non-drift fundamental to replace it, the new data are reconstructed without amplitude drift and hence the spectral leakage is removed. Extensive simulation results and algorithm analysis validate the functionality and robustness of the proposed method. The comparison with other state-of-the-art methods is also presented. The proposed algorithm relaxes the stringent requirement of the test environment, and reduces the test cost significantly.

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Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies

Cited by 6 publications

References 1 publication

How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area

How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area

Research on Cosine-Sum Windows with Maximum Side-Lobe Decay for High Precision ADC Spectral Testing

Accurate spectral testing algorithm of ADC with amplitude drift

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