Revisiting Defect-Induced Light Field Enhancement in Optical Thin Films

Abstract

Based on a finite-difference time-domain method, we revisited the light field intensification in optical films due to defects with different geometries. It was found that defect can induce the local light intensification in optical films and the spherical defects resulted in the highest light intensification among the defect types investigated. Light intensification can increase with defect diameter and the relative refractive index between the defect and the film layer. The shallow defects tended to have the highest light intensification. Finally, the extinction coefficient of the defect had a significant effect on light intensification. Our investigations revealed that the light field intensification induced by a nano-defect is mainly attributed to the interference enhancement of incident light and diffracted or reflected light by defects when the size of the defect is in the subwavelength range.