2013
DOI: 10.1016/j.jcrysgro.2012.12.050
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RF-MBE growth of cubic InN nano-scale dots on cubic GaN

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Cited by 6 publications
(7 citation statements)
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“…This indicates that the three‐dimensional growth of c‐InN took place. Significant differences were not found in the pattern from those for c‐InN dots grown using the just substrates under similar conditions, which was previously reported in our publications .…”
Section: Resultssupporting
confidence: 88%
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“…This indicates that the three‐dimensional growth of c‐InN took place. Significant differences were not found in the pattern from those for c‐InN dots grown using the just substrates under similar conditions, which was previously reported in our publications .…”
Section: Resultssupporting
confidence: 88%
“…Similar structures are also observed for c‐GaN grown using Si (001) substrates . This is due to the existence of two orthogonal domains of c‐GaN: one domain is c‐GaN (001) of which the [110] direction is parallel to [110] of a substrate, while it is parallel to of the substrate in the other domain. The typical scale of the domain size is 300–500 nm, as shown in the image of a c‐GaN surface grown on a MgO (001) substrate taken by atomic force microscopy (AFM) in Fig.…”
Section: Introductionsupporting
confidence: 67%
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“…Straininduced self-organized growth of nano-scale semiconductor dots is one of the convenient methods to obtain high quality quantum dots with high area density [4][5][6][7]. We have recently reported the self-organized growth of nanoscale dots of cubic zincblende phase InN (c-InN) on cubic phase GaN (c-GaN) underlayers by RF-N 2 plasma molecular beam epitaxy (RF-MBE) [8]. Although the cubic phase is metastable for the nitrides, they have several advantages in practical viewpoint compared to nitrides in the hexagonal wurtzite phase.…”
Section: Introductionmentioning
confidence: 99%