High spatial resolution, low inter-pixel crosstalk, high signal-to-noise ratio (SNR), adequate application dependent speed, economical and energy efficient design are common goals sought after for optical image sensors. In optical microscopy, overcoming the diffraction limit in spatial resolution has been achieved using materials chemistry, optimal wavelengths, precision optics and nanomotion-mechanics for pixel-by-pixel scanning. Imagers based on pixelated imaging devices such as CCD/CMOS sensors avoid pixel-by-pixel scanning as all sensor pixels operate in parallel, but these imagers are fundamentally limited by inter-pixel crosstalk, in particular with interspersed bright and dim light zones. In this paper, we propose an agile pixel imager sensor design platform called Coded Access Optical Sensor (CAOS) that can greatly alleviate the mentioned fundamental limitations, empowering smart optical imaging for particular environments. Specifically, this novel CAOS imager engages an application dependent electronically programmable agile pixel platform using hybrid space-time-frequency coded multiple-access of the sampled optical irradiance map. We demonstrate the foundational working principles of the first experimental electronically programmable CAOS imager using hybrid time-frequency multiple access sampling of a known high contrast laser beam irradiance test map, with the CAOS instrument based on a Texas Instruments (TI) Digital Micromirror Device (DMD). This CAOS instrument provides imaging data that exhibits 77 dB electrical SNR and the measured laser beam image irradiance specifications closely match (i.e., within 0.75% error) the laser manufacturer provided beam image irradiance radius numbers. The proposed CAOS imager can be deployed in many scientific and non-scientific applications where pixel agility via electronic programmability can pull out desired features in an irradiance map subject to the CAOS imaging operation.