MTT-S International Microwave Symposium Digest
DOI: 10.1109/mwsym.1986.1132198
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RF Nonlinear Device Characterization Yields Improved Modeling Accuracy

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Cited by 35 publications
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“…1) was used to characterize the two types of MESFETs. Conventional pulsed I-V measurement 0018-9480/01$10.00 ©2001 IEEE [7] begins from a quiescent point where a steady-state trap density is maintained. Submicrosecond pulses are then applied to probe various on states without perturbing the trap density.…”
Section: Model Constructionmentioning
confidence: 99%
“…1) was used to characterize the two types of MESFETs. Conventional pulsed I-V measurement 0018-9480/01$10.00 ©2001 IEEE [7] begins from a quiescent point where a steady-state trap density is maintained. Submicrosecond pulses are then applied to probe various on states without perturbing the trap density.…”
Section: Model Constructionmentioning
confidence: 99%
“…The 180 degrees phase difference corresponded to the minimum mixing transconductance and the sensitivity to the gate bias as described above was verified, but the simulations failed to predict the degree of variation necessary to account for the observed conversion gain range. More data relevant to high-frequency current-voltage characteristics as obtained with Smith et al's technique [17], for instance, would be necessary to pursue further this idea. Nevertheless, this pinch-off voltage shift concept brings enough physical insight to support our simulations.…”
mentioning
confidence: 99%