1980
DOI: 10.1016/0165-1633(80)90012-x
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RF-sputtered CuInSe2 thin films

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Cited by 73 publications
(15 citation statements)
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“…Cu-poor films are found to have higher optical band gap than Cu-rich films. Similar trend was observed in the case of CuInSe 2 films [14][15][16]. Jaffe and Zunger [21], based on band structural calculations in the case of ternary chalcopyrite compounds predicted change in band gap due to p-d hybridization between Cu d-levels and Se p-levels.…”
Section: Optical Propertiessupporting
confidence: 64%
See 1 more Smart Citation
“…Cu-poor films are found to have higher optical band gap than Cu-rich films. Similar trend was observed in the case of CuInSe 2 films [14][15][16]. Jaffe and Zunger [21], based on band structural calculations in the case of ternary chalcopyrite compounds predicted change in band gap due to p-d hybridization between Cu d-levels and Se p-levels.…”
Section: Optical Propertiessupporting
confidence: 64%
“…The results on the dependence of physical properties of copper indium diselenide [14][15][16] and copper indium gallium diselenide [3] on Cu/In and Cu/(In+ Ga) ratios, respectively suggest that there is a need to take up investigations on the effect of Cu/ (Zn+ Sn) ratio on the properties of CZTSe films. These studies enable us to determine the limits of Cu/(Zn +Sn) ratio within which single phase CZTSe films can be obtained and also to optimize the Cu/(Zn +Sn) ratio to obtain CZTSe thin films with the desired properties to suit the device needs.…”
Section: Introductionmentioning
confidence: 92%
“…Its high absorption coefficient, low toxicity, and electrical and optical properties make this compound a major candidate for the next generation of solar cells. Because of this high potential, researchers have developed a variety of techniques to deposit CIS thin films such as flash evaporation [1] [2], co-evaporation [3], sputtering [4] [5], molecular beam epitaxy [6], spray pyrolysis [7] [8], chemical vapour deposition [9] , etc.…”
Section: Introductionmentioning
confidence: 99%
“…In these films the diffraction lines (103 and 211) of the chalcopyrite structure are not observed in the substrate temperature range up to 500ºC. Evidence of a chalcopyrite structure of RF-sputtered CIS films prepared by others groups in the substrate temperature range 400ºC-500ºC have been reported [5]. In figure 3-b), we observe that the film deposited at 300ºC undergoes a structural change which reflects itself in the change from the preferential orientation (112) to what appears to be a preferential (220, 204) orientation.…”
Section: Resultsmentioning
confidence: 76%