2007
DOI: 10.1016/j.jcrysgro.2006.11.294
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RHEED metrology of Stranski–Krastanov quantum dots

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Cited by 25 publications
(20 citation statements)
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“…At the moment, only a few techniques, e.g. reflection high energy electron diffraction (RHEED) 19 , in-situ accumulated stress measurements 20 , and spectroscopic ellipsometry 21 , can give real time information during the growth and thereby help monitoring the growth. But if such techniques provide valuable information about the growth surface, the averaging nature of the techniques make them of little use when study atomic-scale processes such as intermixing or segregation.…”
Section: Introductionmentioning
confidence: 99%
“…At the moment, only a few techniques, e.g. reflection high energy electron diffraction (RHEED) 19 , in-situ accumulated stress measurements 20 , and spectroscopic ellipsometry 21 , can give real time information during the growth and thereby help monitoring the growth. But if such techniques provide valuable information about the growth surface, the averaging nature of the techniques make them of little use when study atomic-scale processes such as intermixing or segregation.…”
Section: Introductionmentioning
confidence: 99%
“…In MBE InAs/GaAs(001), the dynamic evolution of an ensemble of QDs was generally monitored in situ via either RHEED [247][248][249][250][251], the photoluminescence optical properties [252], or XRD [253]. From these experimental observations, a timescale of at least a few seconds for InAs QD growth was extracted; this was regarded as quite fast in comparison with the deposition rate (which is usually 0.1 ML/s).…”
Section: Experimental Observations Of the Timescale Of Inas Qd Growthmentioning
confidence: 99%
“…In Section 3.6, it was mentioned that the timescale for QD growth completion was estimated by techniques such as RHEED [247][248][249][250][251], photoluminescence [252], and XRD [253]. A more direct and accurate measurement method for extracting the timescale is based on snapshots obtained in neighboring regions on the growth surface using STM and ATM.…”
Section: -28mentioning
confidence: 99%
“…Moreover, InAs͑137͒A is relevant since this surface orientation has been found to occur as side facet on InAs quantum dots grown on various GaAs substrates. [10][11][12] In a recent theoretical study, we suggested that the shape evolution of these The InAs͑137͒ surface plane is inclined relative to both the ͑100͒ and the ͑110͒ directions. One surface unit cell contains an As dimer, two threefold coordinated cations ͑one of which is visible in the figure͒, and one threefold coordinated As atom.…”
Section: Introductionmentioning
confidence: 98%