1653(26) Broze, G.; Jerome, R.; Teyssie, Ph.; Marco, C. J. Polym. Sci., (27) Broze, G.; Jerome, R.; Teyssie, Ph.ABSTRACT: T h e temperature dependence of the crystal lattice modulus of polyethylene was measured by X-ray diffraction with use of ultradrawn films produced by gelation/crystallization from dilute solution. Measurements were carried out in the temperature range 20-150 "C for specimens with draw ratios >300. T h e measured crystal lattice modulus was in the range 211-222 GPa, and the values were independent of temperature. I n contrast, the storage modulus of a n ultradrawn film with a draw ratio of 400, 216 GPa a t 20 O C , decreased to 130 GPa a t 140 "C. This discrepancy was related to an increase in the amorphous content and a decrease of the amorphous modulus with increasing temperature.