2006
DOI: 10.1109/lpt.2006.871697
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Ridge-width dependence on high-temperature continuous-wave operation of native oxide-confined InGaAsN triple-quantum-well lasers

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Cited by 14 publications
(15 citation statements)
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“…Note that the results are different from that reported recently [ 20 ]. We believe that the differences are due to the different device dimensions considered since the performance depends strongly on the device dimensions [ 21 , 22 ].…”
Section: Resultsmentioning
confidence: 99%
“…Note that the results are different from that reported recently [ 20 ]. We believe that the differences are due to the different device dimensions considered since the performance depends strongly on the device dimensions [ 21 , 22 ].…”
Section: Resultsmentioning
confidence: 99%
“…The growth was terminated by a 200-nm-thick GaAs capping layer. The wafer was fabricated to 4-μm-wide ridge waveguide laser by pulsed anodic oxidation method [10]. Fig.…”
Section: Experimental Setup Results and Discussionmentioning
confidence: 99%
“…According to previous studies [34,67] regarding the optimization of the ridge height, the entire p-doped layers outside the ridge region were etched through to the QD active region.…”
Section: Fabrication Processmentioning
confidence: 99%