Rietveld analysis, dielectric and magnetic properties of Sr and Ti codoped BiFeO3 multiferroic

Abstract

Polycrystalline Bi 0.8 Sr 0.2 Fe 1 À x Ti x O 3 (x ¼ 0.0, 0.1, 0.2) multiferroics were synthesized via the conventional solid state reaction method. The structure, dielectric relaxation, and magnetic properties of as prepared samples were investigated. The crystal structure examined via XRD and Rietveld analysis confirmed a single phase rhombohedral (space group R3c no. 161) structure. In the Rietveld refinement, good agreement between the observed and calculated pattern was observed. The dielectric response of these multiferroics was analyzed in the frequency range of 10 Hz to 5 MHz at different temperatures. All the samples showed dispersion in dielectric constant ( e) and dielectric loss factor (tan d) values. The temperature dependence of e and tan d showed broad peaks. A reduction in the values of e and tan d was observed upon the incorporation of Ti. Magnetic measurements were carried out at room temperature up to a field of 20 kOe. Magnetic hysteresis loops revealed a significant increase in magnetization with Ti substitution. A remnant magnetization (M r ) of 33.428 memu/g and a coercive field (H c ) of 1.724 kOe were observed in the sample with x ¼ 0.2.

Sol–gel synthesis and investigation of structural, electrical and magnetic properties of Pb doped La0.1Bi0.9FeO3 multiferroics

“…4. Similar trend of dielectric properties has also been reported in Mn [27], Sr [28], Sm [15], Pr [16], and Dy [29] doped BFO materials. The temperature dependent dielectric parameters were studied in the temperature range of 40-200°C.…”

Study on the multiferroic properties of 2-2 type of BiFeO3-CuFe2O4 thin films

“…In order to maintain the neutral, the formation of Fe 2 þ ions is bound to be accompanied by the generation of oxygen vacancies, as shown in Eq. (2-1) [16].…”

Enhanced multiferroic and dielectric properties of Sr2+-doped BiFe0.94(Mn0.04Cr0.02)O3 thin films

“…The ferromagnetic properties of the films were analysed by MPMS-XL-7 superconducting quantum interference magnetic measuring system. To further analyse and obtain the detailed structural information, the measured X-ray diffraction data B 1-x Sr x FMC thin films were simulated with Rietveld refinement [13][14][15] by using Maud program [16,17]. The differences between the measured and simulated XRD patterns for all samples are shown in Fig.…”