2019
DOI: 10.1007/s00339-019-2911-3
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Rietveld refinement of X-ray diffraction, impedance spectroscopy and dielectric relaxation of Li-doped ZnO-sprayed thin films

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Cited by 31 publications
(10 citation statements)
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“…Z ″ gradually reduces with the increase in the frequency, and for 300 and 400 °C, it almost vanishes to zero. This reduces the pattern of Z ′ with the increase in both frequency and temperature, reflecting the semiconductor behavior of the sample . The decrease of the Z ′ and Z ″ values with the enhancement in the temperature suggests the reduction of grain and grain boundary resistance .…”
Section: Results and Discussionmentioning
confidence: 94%
See 1 more Smart Citation
“…Z ″ gradually reduces with the increase in the frequency, and for 300 and 400 °C, it almost vanishes to zero. This reduces the pattern of Z ′ with the increase in both frequency and temperature, reflecting the semiconductor behavior of the sample . The decrease of the Z ′ and Z ″ values with the enhancement in the temperature suggests the reduction of grain and grain boundary resistance .…”
Section: Results and Discussionmentioning
confidence: 94%
“…This reduces the pattern of Z′ with the increase in both frequency and temperature, reflecting the semiconductor behavior of the sample. 64 The decrease of the Z′ and Z″ values with the enhancement in the temperature suggests the reduction of grain and grain boundary resistance. 65 Again, the shift of Z′ toward the lower frequency with an increase in the temperature also confirms the frequency relaxation process in sample.…”
Section: Optical Studymentioning
confidence: 99%
“…The magnitude of ( ¢ Z ) decreases with temperature for all compositions shows NTCR behaviour. The merging of all curves at selected temperatures in the higher frequency sides is due to the release of space charge and a resulting depressing potential barrier [60,[62][63][64]. Moreover, the decreasing impedance values with Cd contents indicate improved ac conductivity with frequency compared to pure ZnO.…”
Section: Morphological Analysismentioning
confidence: 94%
“…An increase in the compressional strain has been reported by Siddique et al with increasing Ni doping (achievement of interstitial sites) level with ZnO [66]. Besides the WH analysis, particle size and strain can also be estimated from size-strain plots [67], using Rietveld refinement of x-ray diffraction [68], etc. table 2 shows the structural parameters of ZnO NPs obtained from the XRD data.…”
Section: Structural Properties 311 Xrd Studiesmentioning
confidence: 97%