1987
DOI: 10.1109/tmtt.1987.1133759
|View full text |Cite
|
Sign up to set email alerts
|

Rigorous Analysis and Network Modeling of the Inset Dielectric Guide

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

2
18
0

Year Published

1992
1992
2009
2009

Publication Types

Select...
3
2
1

Relationship

0
6

Authors

Journals

citations
Cited by 48 publications
(20 citation statements)
references
References 8 publications
2
18
0
Order By: Relevance
“…Moreover since the components of electric field is independently expanded, this method is easily applied to complex edges. It is shown that the convergence of our numerical results is very fast and the relative error is one quarter or less of those obtained by the transverse resonance diffraction method [2] under the same condition. The numerical results for single-and double-layered inset dielectric guides agree well with those of literatures [2,8,10] …”
Section: Introductionmentioning
confidence: 65%
See 4 more Smart Citations
“…Moreover since the components of electric field is independently expanded, this method is easily applied to complex edges. It is shown that the convergence of our numerical results is very fast and the relative error is one quarter or less of those obtained by the transverse resonance diffraction method [2] under the same condition. The numerical results for single-and double-layered inset dielectric guides agree well with those of literatures [2,8,10] …”
Section: Introductionmentioning
confidence: 65%
“…From this results the virtual boundary may be regarded as a perfectly matched boundary. The propagation constants β of the fundamental mode for various frequencies are shown in Table 2 as the function of the mode truncation number N and compared with those obtained by the TRD method [2] and the measured data [8]. The buffer width and the location of the PEC (or PMC) boundary is assumed at d/λ = 0.05 and Table 1.…”
Section: Numerical Resultsmentioning
confidence: 99%
See 3 more Smart Citations