Risk Assessment for the Use of COTS Devices in Space Systems under Consideration of Radiation Effects

Budroweit, Jan; Patscheider, Hagen

doi:10.3390/electronics10091008

Cited by 18 publications

(6 citation statements)

References 9 publications

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“…The plan shall establish a flux range to isolate single ion effects and determine particle fluence levels to confidently assess all sensitive areas for rare event likelihood. As suggested, a typical ion flux range is 1⋅10 3 ions/cm 2 to 1⋅10 5 ions/cm 2 , while a fluence value that resulted historically adequate is 1⋅10 7 ions/cm 2 .…”

Section: Jedec Standardmentioning

confidence: 90%

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COTS Devices for Space Missions in LEO

Brunetti,

Campiti,

Tagliente

et al. 2024

IEEE Access

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In the framework of the NewSpace revolution, time-to-market and budget constraints drive the development of small and medium-sized satellites in Low Earth Orbit (LEO) orbit. The adoption of Commercial Off-the-Shelf (COTS) components represents the current trend to fulfill the NewSpace goals, given their low cost, wide product availability, small time-to-market, and the ability to integrate the most recent advancements in space applications. However, migrating from radiation-hardened (rad-hard) devices to COTS ones requires ensuring comparable reliability levels. To this end, an "upscreening" of the COTS devices and systems should be performed in compliance with widely adopted standard regulations, such as those used by ESA or NASA. In this paper, we review COTS components and systems, such as diodes, Bipolar Junction Transistors (BJTs), Field Effect Transistors (FETs), Operational Amplifiers (OPAMPs), memories, and Field Programmable Gate Arrays (FPGAs), proven-flight or ad-hoc tested for compliance with standard regulations. In conclusion, the most promising devices in terms of cost and radiation tolerances are identified, providing useful benchmarks for space engineers developing COTS-based innovative systems.

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Section: Jedec Standardmentioning

confidence: 90%

“…In this context, the selection of Electrical, Electronic, and Electromechanical (EEE) parts has increasingly leaned towards COTS components [7]. Unlike their space-qualified counterparts, which are specifically designed for space environments, these components are readily available on the market and more cost-effective.…”

Section: Introductionmentioning

confidence: 99%

COTS Devices for Space Missions in LEO

Brunetti,

Campiti,

Tagliente

et al. 2024

IEEE Access

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“…A different approach is necessary to assess the utilization of COTS electronic components for space applications, relying on analytical data rather than depending exclusively on engineering judgment and best-practice experience [42].…”

Section: Discussionmentioning

confidence: 99%

Toward the Use of Electronic Commercial Off-the-Shelf Devices in Space: Assessment of the True Radiation Environment in Low Earth Orbit (LEO)

Gutiérrez,

Prieto,

Perales-Eceiza

et al. 2023

Electronics

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Low Earth orbit missions have become crucial for a variety of applications, from scientific research to commercial purposes. Exposure to ionizing radiation in Low Earth Orbit (LEO) poses a significant risk to both spacecraft and astronauts. In this article, we analyze radiation data obtained from different LEO missions to evaluate the potential of using electronic commercial off-the-shelf (COTS) devices in space missions. This study is focused on the total ionizing dose (TID). Our results demonstrate that COTS technology can effectively provide cost-effective and reliable solutions for space applications. Furthermore, we compare the data obtained from actual missions with computational models and tools, such as SPENVIS, to evaluate the accuracy of these models and enhance radiation exposure prediction. This comparison provides valuable insights into the true radiation environment in space and helps us to better understand the potential of COTS technology in reducing costs and development times by utilizing technology previously used in other areas. In light of the results, we can see that the radiation values observed experimentally in space missions versus the computer simulations used present variations up to a factor of 30 depending on the model used in the analysis.

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“…위성이 작동하는 우주환경은 지상의 환경과 여러 가지 면에서 다른데, 여러 차이점 중 가장 중요한 것이 바로 우주방사선이다. 반도체를 활용한 전자부품의 경우 재 료적인 한계로 인해 방사선이 부품작동에 막대한 영향을 미친다 [2].…”

Section: 서론unclassified

A Study of Static Random Access Memory Single Event Effect (SRAM SEE) Test using 100 MeV Proton Accelerator

Han,

Choi,

Kim

et al. 2023

J. Space Technol. Appl.

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This study aims to develop technology for testing and verifying the space radiation environment of miniature space components using the facilities of the domestic 100 MeV proton accelerator and the Space Component Test Facility at the Space Testing Center. As advancements in space development progress, high-performance satellites increasingly rely on densely integrated circuits, particularly in core components components like memory. The application of semiconductor components in essential devices such as solar panels, optical sensors, and opto-electronics is also on the rise. To apply these technologies in space, it is imperative to undergo space environment testing, with the most critical aspect being the evaluation and testing of space components in high-energy radiation environments. Therefore, the Space Testing Center at the Korea testing laboratory has developed a radiation testing device for memory components and conducted radiation impact assessment tests using it. The investigation was carried out using 100 MeV protons at a low flux level achievable at the Gyeongju Proton Accelerator. Through these tests, single event upsets observed in memory semiconductor components were confirmed.

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Risk Assessment for the Use of COTS Devices in Space Systems under Consideration of Radiation Effects

Cited by 18 publications

References 9 publications

COTS Devices for Space Missions in LEO

COTS Devices for Space Missions in LEO

Toward the Use of Electronic Commercial Off-the-Shelf Devices in Space: Assessment of the True Radiation Environment in Low Earth Orbit (LEO)

A Study of Static Random Access Memory Single Event Effect (SRAM SEE) Test using 100 MeV Proton Accelerator

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