2020
DOI: 10.1021/acsomega.0c02225
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Robust In-Zn-O Thin-Film Transistors with a Bilayer Heterostructure Design and a Low-Temperature Fabrication Process Using Vacuum and Solution Deposited Layers

Abstract: We report on the design, fabrication, and characterization of heterostructure In-Zn-O (IZO) thin-film transistors (TFTs) with improved performance characteristics and robust operation. The heterostructure layer is fabricated by stacking a solution-processed IZO film on top of a buffer layer, which is deposited previously using an electron beam (e-beam) evaporator. A thin buffer layer at the dielectric interface can help to template the structure of the channel. The control of the precursors and of the solvent … Show more

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Cited by 5 publications
(2 citation statements)
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“…Concurrently, the recrystallization of ZnSn(OH) 6 occurs in the system, maintaining dynamic-equilibrium. 70 ZnSn(OH) 6 + 4OH − 4 Sn(OH) 6 2− + Zn(OH) 4…”
Section: Coprecipitation Techniquementioning
confidence: 99%
See 1 more Smart Citation
“…Concurrently, the recrystallization of ZnSn(OH) 6 occurs in the system, maintaining dynamic-equilibrium. 70 ZnSn(OH) 6 + 4OH − 4 Sn(OH) 6 2− + Zn(OH) 4…”
Section: Coprecipitation Techniquementioning
confidence: 99%
“…Accordingly, to overcome this limitation and improve their characteristics, researchers are actively engaged in the development of ternary oxides, such as ZnSnO 3 and In-Zn-O. [5][6][7] Among them, nanostructures of ZnSnO 3 (various nano shapes, such as wires, rods, rings, tubes, cubes, and spheres) have attracted considerable interest owing to their advantageous chemical sensitivity, wide energy bandgap, high transmittance percentage, electron mobility, low price, non-toxicity, and earth abundance. 5,[8][9][10][11][12][13] The performance of energy storage devices and catalysis is greatly affected by the morphology, structure, and physical characteristics of the active electrode materials.…”
Section: Introductionmentioning
confidence: 99%