2005
DOI: 10.1109/mc.2005.70
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Robust system design with built-in soft-error resilience

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Cited by 472 publications
(231 citation statements)
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“…If the robustness of the system meets the safety requirement, the system passes the validation; else the robustness/safety is not adequate, so Phase 3 is activated to enhance the system robustness/safety. Phase 3 (fault-tolerant design and risk reduction): This phase is to develop a feasible riskreduction approach by fault-tolerant design, such as the schemes presented in [Austin, 1999;Mitra et al, 2005;Rotenberg, 1999;Slegel et al, 1999;], to improve the robustness of the critical components identified in Phase 2. The enhanced version then goes to Phase 2 to recheck whether the adopted risk-reduction approach can satisfy the safety/robustness requirement or not.…”
Section: Safety Validation and Risk Reduction Processmentioning
confidence: 99%
“…If the robustness of the system meets the safety requirement, the system passes the validation; else the robustness/safety is not adequate, so Phase 3 is activated to enhance the system robustness/safety. Phase 3 (fault-tolerant design and risk reduction): This phase is to develop a feasible riskreduction approach by fault-tolerant design, such as the schemes presented in [Austin, 1999;Mitra et al, 2005;Rotenberg, 1999;Slegel et al, 1999;], to improve the robustness of the critical components identified in Phase 2. The enhanced version then goes to Phase 2 to recheck whether the adopted risk-reduction approach can satisfy the safety/robustness requirement or not.…”
Section: Safety Validation and Risk Reduction Processmentioning
confidence: 99%
“…Currently research efforts include more sophisticated approaches than simple replication. [18] reuses testing circuitry for error detection and correction and [17] extends hardware with built-in soft error resilience which is able to detect and correct soft errors and even to predict a soon hardware failure. The hardware design presented in [26] on-the-fly replicates executed instructions.…”
Section: Related Workmentioning
confidence: 99%
“…A single event upset (SEU) does not occur unless the SET can survive the circuit masking effects and is captured by a clock edge into a sequential element. The SET can be eliminated by electrical masking, logic masking and temporal masking [9,10].…”
Section: An Environment-based Probabilistic Soft Error Modelmentioning
confidence: 99%
“…For a broad tutorial on this subject one may refer to a recent paper [14]. When neutrons strike silicon, any of more than 100 different nuclear reactions can be generated [9]. Accurate measurement of the neutron flux and its energy distribution are first considerations for estimating neutron-induced error rates.…”
Section: Introductionmentioning
confidence: 99%