2014 International Test Conference 2014
DOI: 10.1109/test.2014.7035321
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Robustness of TAP-based scan networks

Abstract: Abstract-It is common to embed instruments when developing integrated circuits (ICs). These instruments are accessed at postsilicon validation, debugging, wafer sort, package test, burn-in, printed circuit board bring-up, printed circuit board assembly manufacturing test, power-on self-test, and operator-driven infield test. At any of these scenarios, it is of interest to access some but not all of the instruments. IEEE 1149.1-2013 and IEEE 1687 propose Test Access Port based (TAP-based) mechanisms to design f… Show more

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Cited by 5 publications
(4 citation statements)
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References 12 publications
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“…This biphasic behavior is explained by the initially rapid desorption of the drug that coats the surface of the NPs . After that, the slower release is a result from the hydrolysis of PLGA in the aqueous environment, a complex process comprising the polymeric erosion of NPs and/or relaxation of polymer chains, along with the diffusion of the drug from within the NPs . In comparison to Run 08, Run 01 was able to release higher amounts of CUR at each time, variation that increased noticeably after the 12 h burst; thereby reassuring that greater EE is of interest for therapies that demand administration of greater net doses of drugs.…”
Section: Resultsmentioning
confidence: 99%
“…This biphasic behavior is explained by the initially rapid desorption of the drug that coats the surface of the NPs . After that, the slower release is a result from the hydrolysis of PLGA in the aqueous environment, a complex process comprising the polymeric erosion of NPs and/or relaxation of polymer chains, along with the diffusion of the drug from within the NPs . In comparison to Run 08, Run 01 was able to release higher amounts of CUR at each time, variation that increased noticeably after the 12 h burst; thereby reassuring that greater EE is of interest for therapies that demand administration of greater net doses of drugs.…”
Section: Resultsmentioning
confidence: 99%
“…Below, we study robustness of 1687 networks with respect to the changes in access scenario (i.e., change in the number of accesses and the access schedule), and compare seven network design approaches regarding OAT, hardware overhead, and robustness. The complete study can be found in [6].…”
Section: A the Need For Methodologymentioning
confidence: 99%
“…That is, when the sensor and debugging instruments are not needed, their corresponding shift-registers and dedicated SIBs are excluded by programming SIB 2 to be closed. To construct a hierarchical network optimized for multiple scenarios, [6] uses an adaptation of the method in [5] (which was proposed for a single scenario with sequential access schedule).…”
Section: ) Flat Networkmentioning
confidence: 99%
“…This involved, for example, the analysis if the network topology of an ICL network is functionally correct and conclusive (related to IEEE 1687 standards). New efficient and scalable approaches for sophisticated network analysis have been developed [ZAD14a], [ZAD14b], [ZAD16a]. The set of subtasks addressed contained, for example, the adaption of network topologies and mechanisms to support modular test as well as optimizing IEEE 1687 topologies with respect to requirements coming from the monitoring tasks and fault tolerant operation [JUT16a].…”
Section: Analysis Verification and Optimization Of Ieee 1687 Network ...mentioning
confidence: 99%