High etch resistance to oxygen plasma for silicon-containing polymers, and the high thermal
and mechanical robustness of the etching product, silicon oxide, make it attractive to design novel silicon-containing block copolymers for direct patterning of nanostructures on a desired substrate. Here, we
report the synthesis of a series of block copolymers from silicon-containing styrenic monomers and styrene
(St) or 4-acetoxystyrene (AcOSt) using living free radical polymerization via a α-hydride nitroxide-mediated
unimer (α-H unimer). Controlled polymerization with narrow polydispersity (PDI < 1.25) and high yield
(up to 80%) were achieved by optimizing polymerization time and temperature, addition of solvents, use
of rate accelerants, monomer addition sequence, and solvent polarity. Block copolymer morphologies before
and after O2 plasma were studied using small-angle X-ray scattering (SAXS) and transmission electron
microscopy (TEM). When silicon-containing block formed the major phase and silicon concentration was
greater than 12 wt %, the morphology and domain size were maintained after O2 plasma.