Role of magnetic and orbital ordering at the metal-insulator transition inNdNiO3

Abstract

Soft x-ray resonant scattering at the Ni L 2,3 edges is used to test models of magnetic-and orbital-ordering below the metal-insulator transition in NdNiO 3 . The large branching ratio of the L 3 to L 2 intensities of the (1/2 0 1/2) reflection and the observed azimuthal angle and polarization dependence originates form a non-collinear magnetic structure. The absence of an orbital signal and the non-collinear magnetic structure show that the nickelates are materials for which orbital ordering is absent at the metal-insulator transition.

Interfacial properties ofLaMnO3/LaNiO3superlattices grown along (001) and (111) orientations

“…The correction factors used were 1.1 and 1.7 for Ni and Mn, respectively. The number of holes used for Ni was 2.5, taken from charge-transfer ligand-field multiplet simulations for Ni 3+ in nickelates [26,34]. For Mn we used 5.5 holes, which is found in cluster calculations for LaMnO 3 [35].…”

Tailoring the electronic transitions of NdNiO3 films through (111)pc oriented interfaces

“…16,21,23,[31][32][33][34] The signal also exhibits strong linear dichroism (inset of Figure 3(a)), which points to the magnetic origin of the resonant scattering mechanism. 33 This peak can therefore be safely ascribed to the antiferromagnetically ordered phase of R-NiO 3 . Figure 3(b) shows the temperature dependence of the intensity of the Bragg reflection (red curve, left axis) and of the resistivity (grey curve, right axis).…”

Photoinduced melting of magnetic order in the correlated electron insulator NdNiO3

“…29 The epitaxial strain imposed by the substrate determines T MI = 150 K. Below this temperature antiferromagnetic order sets in, as is directly evidenced by resonant soft x-ray diffraction measurements. 30 We carried out optical pump, resonant soft x-ray diffraction probe experiments at two sources. The first, the I06 end station of the Diamond Light Source (DLS), combines 70 ps time resolution (limited by the duration of the x-ray probe pulses) with very high energy resolution, 10 4 resolving power, to measure the evolution of the resonant diffraction line shape.…”